Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry

Meng Chang Hsieh, Jiun-You Lin, Chia Ou Chang

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

This Letter presents a method of an optical sensor for measuring wavelength shifts. The system consists of a diffraction grating and a total internal reflection heterodyne interferometer. As a heterodyne light beam strikes a grating, the first-order diffraction beam is generated. The light penetrates into a total internal reflection prism at an angle larger than the critical angle. A wavelength variation will affect the diffractive angle of the first-order beam, thus inducing a phase difference variation of the light beam emerging from the total internal reflections inside the trapezoid prism. Both the experimental and theoretical results reveal that, for the first-order diffractive beam, the sensitivity and resolution levels are superior to 5°/nm and 0.006 nm, respectively, in the range of wavelength from 632 to 634 nm, and are superior to 3.1°/nm and 0.0095 nm in the range from 632 to 637 nm. For the theoretical simulation of the fourth-order diffractive beam, they are superior to 6.4 deg /nm and 0.0047 nm in the range from 632 to 637 nm.

Original languageEnglish
Article number081202
JournalChinese Optics Letters
Volume14
Issue number8
DOIs
Publication statusPublished - 2016 Aug 10

Fingerprint

Interferometry
interferometry
Wavelength
shift
light beams
wavelengths
prisms
Diffraction gratings
trapezoids
Prisms
optical measuring instruments
gratings (spectra)
emerging
interferometers
Optical sensors
gratings
Interferometers
sensitivity
Diffraction
diffraction

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

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abstract = "This Letter presents a method of an optical sensor for measuring wavelength shifts. The system consists of a diffraction grating and a total internal reflection heterodyne interferometer. As a heterodyne light beam strikes a grating, the first-order diffraction beam is generated. The light penetrates into a total internal reflection prism at an angle larger than the critical angle. A wavelength variation will affect the diffractive angle of the first-order beam, thus inducing a phase difference variation of the light beam emerging from the total internal reflections inside the trapezoid prism. Both the experimental and theoretical results reveal that, for the first-order diffractive beam, the sensitivity and resolution levels are superior to 5°/nm and 0.006 nm, respectively, in the range of wavelength from 632 to 634 nm, and are superior to 3.1°/nm and 0.0095 nm in the range from 632 to 637 nm. For the theoretical simulation of the fourth-order diffractive beam, they are superior to 6.4 deg /nm and 0.0047 nm in the range from 632 to 637 nm.",
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Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry. / Hsieh, Meng Chang; Lin, Jiun-You; Chang, Chia Ou.

In: Chinese Optics Letters, Vol. 14, No. 8, 081202, 10.08.2016.

Research output: Contribution to journalArticle

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