Measurement of small wavelength shift using diffraction grating and high-angular-sensitivity total-internal-reflection heterodyne interferometer

Jiun-You Lin, Jing Hsiang Jhuang, Meng Chang Hsieh, Chia Ou Chang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This study presents a method for detecting small wavelength shifts using grating diffraction effect and high-angular-sensitivity total-internal-reflection (TIR) heterodyne interferometry. In the proposed interferometer, a half-wave plate and a quarter-wave plate that exhibit specific optic-axis azimuths are combined to form a phase shifter. When an isosceles right-angle prism is placed between the phase shifter and an analyzer that exhibits suitable transmission-axis azimuth, it shifts and enhances the phase difference of the s- and p- polarization states of the first-order diffraction beam at one TIR. The enhanced phase difference depends on the diffraction angle, which is a function of the beam wavelength; thus the wavelength shift can be easily and accurately measured by estimating the phase-difference variation. The feasibility of our method was demonstrated with a measurement resolution of approximately 0.007 nm and a sensitivity of 4.3°/nm in a measurement range of 5 nm. This method has the merits of both common-path interferometry and heterodyne interferometry.

Original languageEnglish
Pages (from-to)155-160
Number of pages6
JournalOptics and Lasers in Engineering
Volume100
DOIs
Publication statusPublished - 2018 Jan 1

Fingerprint

Diffraction gratings
gratings (spectra)
Interferometry
Interferometers
interferometry
interferometers
Phase shifters
azimuth
Wavelength
sensitivity
shift
Diffraction
wavelengths
rangefinding
Prisms
diffraction
sands
prisms
Optics
analyzers

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Cite this

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abstract = "This study presents a method for detecting small wavelength shifts using grating diffraction effect and high-angular-sensitivity total-internal-reflection (TIR) heterodyne interferometry. In the proposed interferometer, a half-wave plate and a quarter-wave plate that exhibit specific optic-axis azimuths are combined to form a phase shifter. When an isosceles right-angle prism is placed between the phase shifter and an analyzer that exhibits suitable transmission-axis azimuth, it shifts and enhances the phase difference of the s- and p- polarization states of the first-order diffraction beam at one TIR. The enhanced phase difference depends on the diffraction angle, which is a function of the beam wavelength; thus the wavelength shift can be easily and accurately measured by estimating the phase-difference variation. The feasibility of our method was demonstrated with a measurement resolution of approximately 0.007 nm and a sensitivity of 4.3°/nm in a measurement range of 5 nm. This method has the merits of both common-path interferometry and heterodyne interferometry.",
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Measurement of small wavelength shift using diffraction grating and high-angular-sensitivity total-internal-reflection heterodyne interferometer. / Lin, Jiun-You; Jhuang, Jing Hsiang; Hsieh, Meng Chang; Chang, Chia Ou.

In: Optics and Lasers in Engineering, Vol. 100, 01.01.2018, p. 155-160.

Research output: Contribution to journalArticle

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AB - This study presents a method for detecting small wavelength shifts using grating diffraction effect and high-angular-sensitivity total-internal-reflection (TIR) heterodyne interferometry. In the proposed interferometer, a half-wave plate and a quarter-wave plate that exhibit specific optic-axis azimuths are combined to form a phase shifter. When an isosceles right-angle prism is placed between the phase shifter and an analyzer that exhibits suitable transmission-axis azimuth, it shifts and enhances the phase difference of the s- and p- polarization states of the first-order diffraction beam at one TIR. The enhanced phase difference depends on the diffraction angle, which is a function of the beam wavelength; thus the wavelength shift can be easily and accurately measured by estimating the phase-difference variation. The feasibility of our method was demonstrated with a measurement resolution of approximately 0.007 nm and a sensitivity of 4.3°/nm in a measurement range of 5 nm. This method has the merits of both common-path interferometry and heterodyne interferometry.

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