Mapping coercivity variation on patterned magneto-optical media

Te Ho Wu, L. X. Ye, J. M. Lee, J. C. Wu, Han Ping D. Shieh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Our previous studies indicated that the coercivity of patterned magneto-optical (MO) thin film media is quite different from the non-patterned samples. Especially, the coercivity of the hole area is quite different from the land area. In order to understand the quantitative difference of the coercivity between the hole and land regions, we have used a Kerr microscope to acquire the variation feature of the coercivity over the patterned and non-patterned MO media surface.

Original languageEnglish
Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
EditorsJ. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780373650, 9780780373655
DOIs
Publication statusPublished - 2002 Jan 1
Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

Publication series

NameINTERMAG Europe 2002 - IEEE International Magnetics Conference

Other

Other2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
CountryNetherlands
CityAmsterdam
Period02-04-2802-05-02

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

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  • Cite this

    Wu, T. H., Ye, L. X., Lee, J. M., Wu, J. C., & Shieh, H. P. D. (2002). Mapping coercivity variation on patterned magneto-optical media. In J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, J. De Boeck, & R. Wood (Eds.), INTERMAG Europe 2002 - IEEE International Magnetics Conference [1000595] (INTERMAG Europe 2002 - IEEE International Magnetics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2002.1000595