Magnetization evolution in microstructured permalloy ellipses

J. C. Wu, W. Z. Shieh, Ching Ray Chang, Zung Hang Wei, N. A. Usov

Research output: Chapter in Book/Report/Conference proceedingConference contribution


The advances in nanolithography and new techniques in probing magnetic domain structures such as magnetic force microscopy (MFM) have given scientists an unprecedented way towards the understanding of micromagnetism. We present results of magnetic domain configurations probed at remanent states as well as under external magnetic fields in microstructured Permalloy thin films. Special interest is focused on the formation and evolution of vortex states in elliptical elements. Various ellipses were delineated using standard electron beam lithography, followed by a thermal evaporation of permalloy in the absence of an external magnetic field. The patterned films were then transferred onto a SiN-coated Si-substrate through a lift-off process in acetone. A magnetic force microscope equipped with an external electromagnet was used to investigate the magnetization configurations.

Original languageEnglish
Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
EditorsJ. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780373650, 9780780373655
Publication statusPublished - 2002 Jan 1
Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

Publication series

NameINTERMAG Europe 2002 - IEEE International Magnetics Conference


Other2002 IEEE International Magnetics Conference, INTERMAG Europe 2002

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

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