@inproceedings{a7f472def3474925860dd3d1ca804bab,
title = "Magnetization evolution in microstructured permalloy ellipses",
abstract = "The advances in nanolithography and new techniques in probing magnetic domain structures such as magnetic force microscopy (MFM) have given scientists an unprecedented way towards the understanding of micromagnetism. We present results of magnetic domain configurations probed at remanent states as well as under external magnetic fields in microstructured Permalloy thin films. Special interest is focused on the formation and evolution of vortex states in elliptical elements. Various ellipses were delineated using standard electron beam lithography, followed by a thermal evaporation of permalloy in the absence of an external magnetic field. The patterned films were then transferred onto a SiN-coated Si-substrate through a lift-off process in acetone. A magnetic force microscope equipped with an external electromagnet was used to investigate the magnetization configurations.",
author = "Wu, {J. C.} and Shieh, {W. Z.} and Chang, {Ching Ray} and Wei, {Zung Hang} and Usov, {N. A.}",
year = "2002",
month = "1",
day = "1",
doi = "10.1109/INTMAG.2002.1001103",
language = "English",
series = "INTERMAG Europe 2002 - IEEE International Magnetics Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "J. Fidler and B. Hillebrands and C. Ross and D. Weller and L. Folks and E. Hill and {Vazquez Villalabeitia}, M. and Bain, {J. A.} and {De Boeck}, Jo and R. Wood",
booktitle = "INTERMAG Europe 2002 - IEEE International Magnetics Conference",
address = "United States",
note = "2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 ; Conference date: 28-04-2002 Through 02-05-2002",
}