Leakage currents through In/MgO/n-type Si/In structures

Hou Yen Tsao, Yow Jon Lin, Ya Hui Chen, Hsing Cheng Chang

Research output: Contribution to journalArticle

8 Citations (Scopus)

Fingerprint Dive into the research topics of 'Leakage currents through In/MgO/n-type Si/In structures'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy