Layer- and lateral-resolved magnetization studies using photoemission electron microscopy

D. H. Wei; Y. J. Hsu; Chao Cheng Lin; Chih Huang Lai; J. Y. Ou; J. C. Wu

doi:10.1016/j.jmmm.2004.04.011

Layer- and lateral-resolved magnetization studies using photoemission electron microscopy

D. H. Wei, Y. J. Hsu, Chao Cheng Lin, Chih Huang Lai, J. Y. Ou, J. C. Wu

Department of Physics

Research output: Contribution to journal › Conference article › peer-review

7 Citations (Scopus)

Abstract

The magnetic circular dichroism in X-ray absorption is employed to study the element-specific magnetization in a TbFe/Co bilayer system and patterned Ni₈₀Fe₂₀ film. Taking advantage of the energy tunability as well as the penetration power of synchrotron radiation, the magnetization directions of Co and Fe deposited in different layers were examined as a function of Co film thickness. For patterned films, the photoemission electron microscope reveals a clear correlation between the magnetic configurations and geometries of the patterns.

Original language	English
Pages (from-to)	49-52
Number of pages	4
Journal	Journal of Magnetism and Magnetic Materials
Volume	282
Issue number	1-3
DOIs	https://doi.org/10.1016/j.jmmm.2004.04.011
Publication status	Published - 2004 Nov 1
Event	International Symposium on Advanced Magnetic Technologies - Taipei, Taiwan Duration: 2003 Nov 13 → 2003 Nov 16

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1016/j.jmmm.2004.04.011

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title = "Layer- and lateral-resolved magnetization studies using photoemission electron microscopy",

abstract = "The magnetic circular dichroism in X-ray absorption is employed to study the element-specific magnetization in a TbFe/Co bilayer system and patterned Ni80Fe20 film. Taking advantage of the energy tunability as well as the penetration power of synchrotron radiation, the magnetization directions of Co and Fe deposited in different layers were examined as a function of Co film thickness. For patterned films, the photoemission electron microscope reveals a clear correlation between the magnetic configurations and geometries of the patterns.",

author = "Wei, {D. H.} and Hsu, {Y. J.} and Lin, {Chao Cheng} and Lai, {Chih Huang} and Ou, {J. Y.} and Wu, {J. C.}",

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note = "International Symposium on Advanced Magnetic Technologies ; Conference date: 13-11-2003 Through 16-11-2003",

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TY - JOUR

T1 - Layer- and lateral-resolved magnetization studies using photoemission electron microscopy

AU - Wei, D. H.

AU - Hsu, Y. J.

AU - Lin, Chao Cheng

AU - Lai, Chih Huang

AU - Ou, J. Y.

AU - Wu, J. C.

PY - 2004/11/1

Y1 - 2004/11/1

N2 - The magnetic circular dichroism in X-ray absorption is employed to study the element-specific magnetization in a TbFe/Co bilayer system and patterned Ni80Fe20 film. Taking advantage of the energy tunability as well as the penetration power of synchrotron radiation, the magnetization directions of Co and Fe deposited in different layers were examined as a function of Co film thickness. For patterned films, the photoemission electron microscope reveals a clear correlation between the magnetic configurations and geometries of the patterns.

AB - The magnetic circular dichroism in X-ray absorption is employed to study the element-specific magnetization in a TbFe/Co bilayer system and patterned Ni80Fe20 film. Taking advantage of the energy tunability as well as the penetration power of synchrotron radiation, the magnetization directions of Co and Fe deposited in different layers were examined as a function of Co film thickness. For patterned films, the photoemission electron microscope reveals a clear correlation between the magnetic configurations and geometries of the patterns.

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U2 - 10.1016/j.jmmm.2004.04.011

DO - 10.1016/j.jmmm.2004.04.011

M3 - Conference article

AN - SCOPUS:5744254027

VL - 282

SP - 49

EP - 52

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

SN - 0304-8853

IS - 1-3

T2 - International Symposium on Advanced Magnetic Technologies

Y2 - 13 November 2003 through 16 November 2003

ER -