Lamp flicker measurement and mitigation

Chau-Shing Wang, Michael J. Devaney

Research output: Contribution to conferencePaper

Abstract

Light flicker, a phenomenon of annoying light intensity variation, caused by fluctuating electrical loads has been a major concern for both industrial and residential customers. This paper presents a novel Dynamic Phase Controller (DPC) for flicker mitigation by compensating the rms voltage every half-cycle of line voltage. A widely-adopted approach of flicker measurement, IEC flickermeter standard, is employed to assess the flicker reduction provided by the DPC. A virtual IEC flickermeter is developed to perform the flicker measurement which demonstrates the DPC capable of efficient flicker mitigation.

Original languageEnglish
Pages355-360
Number of pages6
Publication statusPublished - 2003 Jul 11
EventProceedings of the 20th IEEE Information and Measurement Technology Conference - Vail, CO, United States
Duration: 2003 May 202003 May 22

Other

OtherProceedings of the 20th IEEE Information and Measurement Technology Conference
CountryUnited States
CityVail, CO
Period03-05-2003-05-22

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Electric lamps
Controllers
Electric potential

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Wang, C-S., & Devaney, M. J. (2003). Lamp flicker measurement and mitigation. 355-360. Paper presented at Proceedings of the 20th IEEE Information and Measurement Technology Conference, Vail, CO, United States.
Wang, Chau-Shing ; Devaney, Michael J. / Lamp flicker measurement and mitigation. Paper presented at Proceedings of the 20th IEEE Information and Measurement Technology Conference, Vail, CO, United States.6 p.
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Wang, C-S & Devaney, MJ 2003, 'Lamp flicker measurement and mitigation' Paper presented at Proceedings of the 20th IEEE Information and Measurement Technology Conference, Vail, CO, United States, 03-05-20 - 03-05-22, pp. 355-360.

Lamp flicker measurement and mitigation. / Wang, Chau-Shing; Devaney, Michael J.

2003. 355-360 Paper presented at Proceedings of the 20th IEEE Information and Measurement Technology Conference, Vail, CO, United States.

Research output: Contribution to conferencePaper

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Wang C-S, Devaney MJ. Lamp flicker measurement and mitigation. 2003. Paper presented at Proceedings of the 20th IEEE Information and Measurement Technology Conference, Vail, CO, United States.