Investigation of wavelength-dependent efficiency droop in InGaN light-emitting diodes

J. R. Chen, Y. C. Wu, S. C. Ling, Tsung-Shine Ko, T. C. Lu, H. C. Kuo, Yen-Kuang Kuo, S. C. Wang

Research output: Contribution to journalArticlepeer-review

43 Citations (Scopus)


The physical mechanisms leading to the efficiency droop of InGaN/GaN light-emitting diodes (LEDs) are theoretically investigated. We first discuss the effect of Auger recombination loss on efficiency droop by taking different Auger coefficients into account. It is found that the Auger recombination process plays a significant nonradiative part for carriers at typical LED operation currents when the Auger coefficient is on the order of 10 -30 cm6∈s-1. Furthermore, the InGaN/GaN multiple-quantum-well (MQW) LEDs with varied indium compositions in InGaN quantum wells are studied to analyze the wavelength-dependent efficiency droop. The simulation results show that the wavelength-dependent efficiency droop is caused by several different effects including non-uniform carrier distribution, electron overflow, built-in electrostatic field induced by spontaneous and piezoelectric polarization, and Auger recombination loss. These internal physical mechanisms are the critical factors resulting in the wavelength-dependent efficiency droop in InGaN/GaN MQW LEDs.

Original languageEnglish
Pages (from-to)779-789
Number of pages11
JournalApplied Physics B: Lasers and Optics
Issue number4
Publication statusPublished - 2010 Mar 1

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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