Investigation of Permalloy cross structure using magnetic force microscope and magnetoresistance measurement

Y. C. Chang, C. C. Chang, Ida Chang, J. C. Wu, Zung Hang Wei, Mei Feng Lai, Ching Ray Chang

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26 Citations (Scopus)

Abstract

Magnetic properties of microstructured Permalloy thin film cross have been studied using magnetic force microscopy and magnetoresistance measurement. Three types of magnetization configurations formed within the junction area were observed, including two kinds of magnetic pattern having two inward and two outward magnetizations and one with three outward and one inward magnetizations. The presence of those variant magnetic configurations gives rise to an irreversible magnetoresistance behavior originated from the distinct magnetization history. Asynchronous magnetization reversal of each arm provides a chance to manipulate the magnetic pattern of the cross.

Original languageEnglish
Article number08B710
JournalJournal of Applied Physics
Volume99
Issue number8
DOIs
Publication statusPublished - 2006 May 25

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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