Investigation of Permalloy cross structure using magnetic force microscope and magnetoresistance measurement

Y. C. Chang, C. C. Chang, Ida Chang, J. C. Wu, Zung Hang Wei, Mei Feng Lai, Ching Ray Chang

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

Magnetic properties of microstructured Permalloy thin film cross have been studied using magnetic force microscopy and magnetoresistance measurement. Three types of magnetization configurations formed within the junction area were observed, including two kinds of magnetic pattern having two inward and two outward magnetizations and one with three outward and one inward magnetizations. The presence of those variant magnetic configurations gives rise to an irreversible magnetoresistance behavior originated from the distinct magnetization history. Asynchronous magnetization reversal of each arm provides a chance to manipulate the magnetic pattern of the cross.

Original languageEnglish
Article number08B710
JournalJournal of Applied Physics
Volume99
Issue number8
DOIs
Publication statusPublished - 2006 May 25

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Permalloys (trademark)
microscopes
magnetization
magnetic force microscopy
configurations
histories
magnetic properties
thin films

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Chang, Y. C. ; Chang, C. C. ; Chang, Ida ; Wu, J. C. ; Wei, Zung Hang ; Lai, Mei Feng ; Chang, Ching Ray. / Investigation of Permalloy cross structure using magnetic force microscope and magnetoresistance measurement. In: Journal of Applied Physics. 2006 ; Vol. 99, No. 8.
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Investigation of Permalloy cross structure using magnetic force microscope and magnetoresistance measurement. / Chang, Y. C.; Chang, C. C.; Chang, Ida; Wu, J. C.; Wei, Zung Hang; Lai, Mei Feng; Chang, Ching Ray.

In: Journal of Applied Physics, Vol. 99, No. 8, 08B710, 25.05.2006.

Research output: Contribution to journalArticle

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AU - Lai, Mei Feng

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