Abstract
The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).
| Original language | English |
|---|---|
| Pages (from-to) | GP-12 |
| Journal | Digests of the Intermag Conference |
| Publication status | Published - 1999 Dec 1 |
| Event | Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea Duration: 1999 May 18 → 1999 May 21 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
Fingerprint Dive into the research topics of 'In-situ investigation of patterned magnetic domain structures using magnetic force microscope'. Together they form a unique fingerprint.
Cite this
Wu, J. C., Huang, Y. W., Huang, H. W., & Wu, T. H. (1999). In-situ investigation of patterned magnetic domain structures using magnetic force microscope. Digests of the Intermag Conference, GP-12.