In-situ investigation of patterned magnetic domain structures using magnetic force microscope

J. C. Wu, Y. W. Huang, H. W. Huang, Te ho Wu

Research output: Contribution to journalConference article

Abstract

The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).

Original languageEnglish
Pages (from-to)GP-12
JournalDigests of the Intermag Conference
Publication statusPublished - 1999 Dec 1
EventProceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea
Duration: 1999 May 181999 May 21

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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