In-situ investigation of patterned magnetic domain structures using magnetic force microscope

J. C. Wu, Y. W. Huang, H. W. Huang, Te ho Wu

Research output: Contribution to journal › Conference article

Abstract

The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).

Original languageEnglish
Pages (from-to)GP-12
JournalDigests of the Intermag Conference
Publication statusPublished - 1999 Dec 1
EventProceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea
Duration: 1999 May 18 → 1999 May 21

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Magnetic domains
Magnetic thin film devices
Microscopes

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Wu, J. C. ; Huang, Y. W. ; Huang, H. W. ; Wu, Te ho. / In-situ investigation of patterned magnetic domain structures using magnetic force microscope. In: Digests of the Intermag Conference. 1999 ; pp. GP-12.
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year = "1999",
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Wu, JC, Huang, YW, Huang, HW & Wu, TH 1999, 'In-situ investigation of patterned magnetic domain structures using magnetic force microscope', Digests of the Intermag Conference, pp. GP-12.

In-situ investigation of patterned magnetic domain structures using magnetic force microscope. / Wu, J. C.; Huang, Y. W.; Huang, H. W.; Wu, Te ho.

In: Digests of the Intermag Conference, 01.12.1999, p. GP-12.

Research output: Contribution to journal › Conference article

TY - JOUR

T1 - In-situ investigation of patterned magnetic domain structures using magnetic force microscope

AU - Wu, J. C.

AU - Huang, Y. W.

AU - Huang, H. W.

AU - Wu, Te ho

PY - 1999/12/1

Y1 - 1999/12/1

N2 - The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).

AB - The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).

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Wu JC, Huang YW, Huang HW, Wu TH. In-situ investigation of patterned magnetic domain structures using magnetic force microscope. Digests of the Intermag Conference. 1999 Dec 1;GP-12.

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