In-situ investigation of patterned magnetic domain structures using magnetic force microscope

J. C. Wu, Y. W. Huang, H. W. Huang, Te ho Wu

Research output: Contribution to journalConference article

Abstract

The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).

Original languageEnglish
Pages (from-to)GP-12
JournalDigests of the Intermag Conference
Publication statusPublished - 1999 Dec 1
EventProceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea
Duration: 1999 May 181999 May 21

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Magnetic domains
Magnetic thin film devices
Microscopes

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

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title = "In-situ investigation of patterned magnetic domain structures using magnetic force microscope",
abstract = "The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).",
author = "Wu, {J. C.} and Huang, {Y. W.} and Huang, {H. W.} and Wu, {Te ho}",
year = "1999",
month = "12",
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journal = "Digests of the Intermag Conference",
issn = "0074-6843",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

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In-situ investigation of patterned magnetic domain structures using magnetic force microscope. / Wu, J. C.; Huang, Y. W.; Huang, H. W.; Wu, Te ho.

In: Digests of the Intermag Conference, 01.12.1999, p. GP-12.

Research output: Contribution to journalConference article

TY - JOUR

T1 - In-situ investigation of patterned magnetic domain structures using magnetic force microscope

AU - Wu, J. C.

AU - Huang, Y. W.

AU - Huang, H. W.

AU - Wu, Te ho

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