Abstract
The understanding of magnetic domain reversal is crucial for many practical applications of magnetic thin film devices. This work demonstrates an easier way for in-situ observation of magnetic domain structures and domain reversal by using magnetic force microscope (MFM).
Original language | English |
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Pages (from-to) | GP-12 |
Journal | Digests of the Intermag Conference |
Publication status | Published - 1999 Dec 1 |
Event | Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea Duration: 1999 May 18 → 1999 May 21 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering