In-situ investigation of patterned magnetic domain structures using magnetic force microscope

J. C. Wu, H. W. Huang, Y. W. Huang, Te Ho Wu

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

novel method for in-situ investigation of patterned magnetic domain structures is presented. Micronlength scales of permalloy thin film fabricated by a lift-off process using electron beam lithography were placed on the top and adjacent to an Aluminum strip, A magnetic force microscope was used to take continuous images of the patterned permalloy films while an electrical current was applied in the aluminum strip, with which a magnetic field was established through the patterned permalloy films in the perpendicular and plane direction. As a result, changes of the magnetic domain structures were observed in the presence of the applied magnetic field.

Original languageEnglish
Pages (from-to)3481-3483
Number of pages3
JournalIEEE Transactions on Magnetics
Volume35
Issue number5 PART 2
DOIs
Publication statusPublished - 1999 Dec 1

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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