Improvement of the shift tolerance to the double random phase encoding encryption system

Bor Wang, Ching Cherng Sun, Wei-Chia Su

Research output: Contribution to journalArticle

Abstract

Double random phase encoding technique is a valuable and effective method for optical image encryption. However, a precise alignment is required when optical setup is performed. In this paper, we investigate the shift tolerance property of the technique. The theory of the robustness to data loss of the encrypted image is proposed. According to the theory, we propose a simple and novel method to improve the shift tolerance of the decrypting phase mask. Both theory and computer simulation are presented.

Original languageEnglish
Pages (from-to)215-221
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3804
Publication statusPublished - 1999 Dec 1

Fingerprint

Encryption
Cryptography
Tolerance
coding
Encoding
shift
Image Encryption
Masks
masks
computerized simulation
alignment
Mask
Computer simulation
Alignment
Computer Simulation
Robustness
simulation

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

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Improvement of the shift tolerance to the double random phase encoding encryption system. / Wang, Bor; Sun, Ching Cherng; Su, Wei-Chia.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3804, 01.12.1999, p. 215-221.

Research output: Contribution to journalArticle

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