Double random phase encoding technique is a valuable and effective method for optical image encryption. However, a precise alignment is required when optical setup is performed. In this paper, we investigate the shift tolerance property of the technique. The theory of the robustness to data loss of the encrypted image is proposed. According to the theory, we propose a simple and novel method to improve the shift tolerance of the decrypting phase mask. Both theory and computer simulation are presented.
|Number of pages||7|
|Journal||Proceedings of SPIE - The International Society for Optical Engineering|
|Publication status||Published - 1999 Dec 1|
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
- Condensed Matter Physics