Improvement in viewing angle properties of top-emitting organic light-emitting devices

Bo Ting Liou, Miao Chan Tsai, Yi Hsiang Huang, Fang Ming Chen, Yu Rui Lin, Yen-Kuang Kuo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The blue shift of viewing angle in the top-emitting organic light-emitting devices is discussed in this study. For the single-mode cavity, the device of anode metal/ m-MTDATA (40 nm)/ α-NPD (10 nm)/ Alq3 (47.6 nm)/ LiF (1 nm)/ Ag (20 nm) with the metal phase difference of 1.30 π has the minimum blue shift of viewing angle. For the double-mode cavity, the recombination area must be away from the cathode for the device with better performance. However, the double-mode cavity with only one recombination area still has worse FWHM and gets more serious the blue shift of viewing angle than the single-mode cavity. Therefore, the double-mode cavity with a recombination area at each antinode is performed, and the results prove that the blue shift of viewing angle and the FWHM are improved. Finally, we replace the emission layer with Alq3:DCM (0.01%) and adjust the main peak wavelength in the double-mode cavity by adjusting the thicknesses of the cavity. The results show that the FWHM and the blue shift of viewing angle obtain further improvement for the double-mode cavity with a recombination area at each antinode.

Original languageEnglish
Title of host publicationOrganic Photonic Materials and Devices XIII
DOIs
Publication statusPublished - 2011 May 2
EventOrganic Photonic Materials and Devices XIII - San Francisco, CA, United States
Duration: 2011 Jan 242011 Jan 26

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7935
ISSN (Print)0277-786X

Other

OtherOrganic Photonic Materials and Devices XIII
CountryUnited States
CitySan Francisco, CA
Period11-01-2411-01-26

Fingerprint

Property of angle
Full width at half maximum
Cavity
blue shift
cavities
Metals
Recombination
Angle
antinodes
Anodes
Cathodes
Single Mode
Wavelength
Phase Difference
metals
anodes
cathodes
adjusting

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Liou, B. T., Tsai, M. C., Huang, Y. H., Chen, F. M., Lin, Y. R., & Kuo, Y-K. (2011). Improvement in viewing angle properties of top-emitting organic light-emitting devices. In Organic Photonic Materials and Devices XIII [793515] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7935). https://doi.org/10.1117/12.874157
Liou, Bo Ting ; Tsai, Miao Chan ; Huang, Yi Hsiang ; Chen, Fang Ming ; Lin, Yu Rui ; Kuo, Yen-Kuang. / Improvement in viewing angle properties of top-emitting organic light-emitting devices. Organic Photonic Materials and Devices XIII. 2011. (Proceedings of SPIE - The International Society for Optical Engineering).
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Liou, BT, Tsai, MC, Huang, YH, Chen, FM, Lin, YR & Kuo, Y-K 2011, Improvement in viewing angle properties of top-emitting organic light-emitting devices. in Organic Photonic Materials and Devices XIII., 793515, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7935, Organic Photonic Materials and Devices XIII, San Francisco, CA, United States, 11-01-24. https://doi.org/10.1117/12.874157

Improvement in viewing angle properties of top-emitting organic light-emitting devices. / Liou, Bo Ting; Tsai, Miao Chan; Huang, Yi Hsiang; Chen, Fang Ming; Lin, Yu Rui; Kuo, Yen-Kuang.

Organic Photonic Materials and Devices XIII. 2011. 793515 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7935).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Liou BT, Tsai MC, Huang YH, Chen FM, Lin YR, Kuo Y-K. Improvement in viewing angle properties of top-emitting organic light-emitting devices. In Organic Photonic Materials and Devices XIII. 2011. 793515. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.874157