HYPERA: High-yield performance-efficient redundancy analysis

Tsung Chu Huang, Kuei Yeh Lu, Yen Chieh Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

A novel memory repair architecture based on redundant hypercube is proposed, which mainly consists of a modified ternary CAM with an address bubble-shifter. Generally for an acceptable repair rate about 3% of spare subcubes and no more than 5% of hardware overhead are required. A modified Quine-McCluskey algorithm and the Essential Cube Pivoting algorithm are also developed for redundancy analysis. Almost 100% of repair rate can be obtained using only 32 equivalent rows under reasonable situations. Under less spare memory the repair rates of proposed approaches can be much higher than most results of previous work.

Original languageEnglish
Title of host publicationProceedings - 2010 19th IEEE Asian Test Symposium, ATS 2010
Pages231-236
Number of pages6
DOIs
Publication statusPublished - 2010 Dec 1
Event2010 19th IEEE Asian Test Symposium, ATS 2010 - Shanghai, China
Duration: 2010 Dec 12010 Dec 4

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Other

Other2010 19th IEEE Asian Test Symposium, ATS 2010
CountryChina
CityShanghai
Period10-12-0110-12-04

Fingerprint

Redundancy
Repair
Data storage equipment
Computer aided manufacturing
Hardware

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Huang, T. C., Lu, K. Y., & Huang, Y. C. (2010). HYPERA: High-yield performance-efficient redundancy analysis. In Proceedings - 2010 19th IEEE Asian Test Symposium, ATS 2010 (pp. 231-236). [5692252] (Proceedings of the Asian Test Symposium). https://doi.org/10.1109/ATS.2010.48
Huang, Tsung Chu ; Lu, Kuei Yeh ; Huang, Yen Chieh. / HYPERA : High-yield performance-efficient redundancy analysis. Proceedings - 2010 19th IEEE Asian Test Symposium, ATS 2010. 2010. pp. 231-236 (Proceedings of the Asian Test Symposium).
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Huang, TC, Lu, KY & Huang, YC 2010, HYPERA: High-yield performance-efficient redundancy analysis. in Proceedings - 2010 19th IEEE Asian Test Symposium, ATS 2010., 5692252, Proceedings of the Asian Test Symposium, pp. 231-236, 2010 19th IEEE Asian Test Symposium, ATS 2010, Shanghai, China, 10-12-01. https://doi.org/10.1109/ATS.2010.48

HYPERA : High-yield performance-efficient redundancy analysis. / Huang, Tsung Chu; Lu, Kuei Yeh; Huang, Yen Chieh.

Proceedings - 2010 19th IEEE Asian Test Symposium, ATS 2010. 2010. p. 231-236 5692252 (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Huang TC, Lu KY, Huang YC. HYPERA: High-yield performance-efficient redundancy analysis. In Proceedings - 2010 19th IEEE Asian Test Symposium, ATS 2010. 2010. p. 231-236. 5692252. (Proceedings of the Asian Test Symposium). https://doi.org/10.1109/ATS.2010.48