High-speed low-voltage built-in current sensor

T. C. Huang, M. C. Huang, K. J. Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Abstract

This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.

Original languageEnglish
Title of host publicationIEEE International Workshop on IDDQ Testing, Digest of Papers
Editors Anon
PublisherIEEE Comp Soc
Pages90-94
Number of pages5
Publication statusPublished - 1997 Dec 1
EventProceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing - Washington, DC, USA
Duration: 1997 Nov 51997 Nov 6

Other

OtherProceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing
CityWashington, DC, USA
Period97-11-0597-11-06

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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