High-speed low-voltage built-in current sensor

T. C. Huang, M. C. Huang, K. J. Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Abstract

This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.

Original languageEnglish
Title of host publicationIEEE International Workshop on IDDQ Testing, Digest of Papers
Editors Anon
PublisherIEEE Comp Soc
Pages90-94
Number of pages5
Publication statusPublished - 1997 Dec 1
EventProceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing - Washington, DC, USA
Duration: 1997 Nov 51997 Nov 6

Other

OtherProceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing
CityWashington, DC, USA
Period97-11-0597-11-06

Fingerprint

Sensors
Electric potential
Mirrors
Voltage drop

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Huang, T. C., Huang, M. C., & Lee, K. J. (1997). High-speed low-voltage built-in current sensor. In Anon (Ed.), IEEE International Workshop on IDDQ Testing, Digest of Papers (pp. 90-94). IEEE Comp Soc.
Huang, T. C. ; Huang, M. C. ; Lee, K. J. / High-speed low-voltage built-in current sensor. IEEE International Workshop on IDDQ Testing, Digest of Papers. editor / Anon. IEEE Comp Soc, 1997. pp. 90-94
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Huang, TC, Huang, MC & Lee, KJ 1997, High-speed low-voltage built-in current sensor. in Anon (ed.), IEEE International Workshop on IDDQ Testing, Digest of Papers. IEEE Comp Soc, pp. 90-94, Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing, Washington, DC, USA, 97-11-05.

High-speed low-voltage built-in current sensor. / Huang, T. C.; Huang, M. C.; Lee, K. J.

IEEE International Workshop on IDDQ Testing, Digest of Papers. ed. / Anon. IEEE Comp Soc, 1997. p. 90-94.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Huang TC, Huang MC, Lee KJ. High-speed low-voltage built-in current sensor. In Anon, editor, IEEE International Workshop on IDDQ Testing, Digest of Papers. IEEE Comp Soc. 1997. p. 90-94