Abstract
This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.
| Original language | English |
|---|---|
| Title of host publication | IEEE International Workshop on IDDQ Testing, Digest of Papers |
| Editors | Anon |
| Publisher | IEEE Comp Soc |
| Pages | 90-94 |
| Number of pages | 5 |
| Publication status | Published - 1997 Dec 1 |
| Event | Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing - Washington, DC, USA Duration: 1997 Nov 5 → 1997 Nov 6 |
Other
| Other | Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing |
|---|---|
| City | Washington, DC, USA |
| Period | 97-11-05 → 97-11-06 |
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All Science Journal Classification (ASJC) codes
- Engineering(all)
Cite this
}
High-speed low-voltage built-in current sensor. / Huang, T. C.; Huang, M. C.; Lee, K. J.
IEEE International Workshop on IDDQ Testing, Digest of Papers. ed. / Anon. IEEE Comp Soc, 1997. p. 90-94.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - High-speed low-voltage built-in current sensor
AU - Huang, T. C.
AU - Huang, M. C.
AU - Lee, K. J.
PY - 1997/12/1
Y1 - 1997/12/1
N2 - This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.
AB - This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.
UR - http://www.scopus.com/inward/record.url?scp=0031359734&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0031359734&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0031359734
SP - 90
EP - 94
BT - IEEE International Workshop on IDDQ Testing, Digest of Papers
A2 - Anon, null
PB - IEEE Comp Soc
ER -