Abstract
This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.
Original language | English |
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Title of host publication | IEEE International Workshop on IDDQ Testing, Digest of Papers |
Editors | Anon |
Publisher | IEEE Comp Soc |
Pages | 90-94 |
Number of pages | 5 |
Publication status | Published - 1997 Dec 1 |
Event | Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing - Washington, DC, USA Duration: 1997 Nov 5 → 1997 Nov 6 |
Other
Other | Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing |
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City | Washington, DC, USA |
Period | 97-11-05 → 97-11-06 |
All Science Journal Classification (ASJC) codes
- Engineering(all)