High-speed low-voltage built-in current sensor

T. C. Huang; M. C. Huang; K. J. Lee

High-speed low-voltage built-in current sensor

T. C. Huang, M. C. Huang, K. J. Lee

Department of Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

15 Citations (Scopus)

Abstract

This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.

Original language	English
Title of host publication	IEEE International Workshop on IDDQ Testing, Digest of Papers
Editors	Anon
Publisher	IEEE Comp Soc
Pages	90-94
Number of pages	5
Publication status	Published - 1997 Dec 1
Event	Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing - Washington, DC, USA Duration: 1997 Nov 5 → 1997 Nov 6

Other

Other	Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing
City	Washington, DC, USA
Period	97-11-05 → 97-11-06

All Science Journal Classification (ASJC) codes

Engineering(all)

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Cite this

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title = "High-speed low-voltage built-in current sensor",

abstract = "This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.",

author = "Huang, {T. C.} and Huang, {M. C.} and Lee, {K. J.}",

year = "1997",

month = dec,

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language = "English",

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editor = "Anon",

booktitle = "IEEE International Workshop on IDDQ Testing, Digest of Papers",

publisher = "IEEE Comp Soc",

note = "Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing ; Conference date: 05-11-1997 Through 06-11-1997",

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AU - Huang, M. C.

AU - Lee, K. J.

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N2 - This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.

AB - This paper presents a high-speed low-voltage built-in current sensor. It mainly utilizes a bulk-driven current mirror as a current sensor to reduce the power supply voltage drop. Based on this technique, we develop an analytic and empirical model to design the built-in current sensor. Experimental results show that the bulk-driven built-in current sensor can have high speed and low area overhead under a low power supply voltage.

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AN - SCOPUS:0031359734

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BT - IEEE International Workshop on IDDQ Testing, Digest of Papers

A2 - Anon, null

PB - IEEE Comp Soc

T2 - Proceedings of the 1997 3rd IEEE International Workshop on IDDQ Testing

Y2 - 5 November 1997 through 6 November 1997

ER -