Fabrication and characterization of microstructured magnetic tunnel junction rings

C. C. Chen; C. C. Chang; C. Y. Kuo; Lance Horng; J. C. Wu

doi:10.1109/TMAG.2006.878868

Fabrication and characterization of microstructured magnetic tunnel junction rings

C. C. Chen, C. C. Chang, C. Y. Kuo, Lance Horng, J. C. Wu

Department of Physics

Research output: Contribution to journal › Article

17 Citations (Scopus)

Abstract

Microstructured magnetic tunnel junction rings have been fabricated by a top-down technique combining electron beam lithography and ion milling process. Four-terminal magnetoresistance measurements and magnetic force microscopy were used to successfully explore a four-transition process within the free layer throughout the magnetization reversal. Various magnetization configurations were identified to be the onion state, vortex-pair state, vortex state, vortex-core state, and reverse onion state. In addition, the various durations of each magnetic state observed in the magnetoresistance curve can be utilized for the study of a coupling effect between the pinned layer and the free layer.

Original language	English
Pages (from-to)	2766-2768
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	42
Issue number	10
DOIs	https://doi.org/10.1109/TMAG.2006.878868
Publication status	Published - 2006 Oct

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All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Cite this

Chen, C. C., Chang, C. C., Kuo, C. Y., Horng, L., & Wu, J. C. (2006). Fabrication and characterization of microstructured magnetic tunnel junction rings. IEEE Transactions on Magnetics, 42(10), 2766-2768. https://doi.org/10.1109/TMAG.2006.878868

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10.1109/TMAG.2006.878868