Abstract
An in situ observation of magnetic domain structure evolution in the presence of an external magnetic field induced from a live current strip produced underneath patterned permalloy thin films is presented. The signal due to the electrostatic force was avoided during the magnetic force microscope imaging by adding an electrically grounded metal film in-between the patterned films and the current strip. Magnetization reversal on a 6 μm permalloy disk was imaged, whereas magnetic domain structure on higher aspect ratios of ellipse and rectangle permalloy elements showed great changes but a much higher field was required for magnetization saturation due to their high coercive and saturation fields.
| Original language | English |
|---|---|
| Pages (from-to) | 2978-2980 |
| Number of pages | 3 |
| Journal | IEEE Transactions on Magnetics |
| Volume | 36 |
| Issue number | 5 I |
| DOIs | |
| Publication status | Published - 2000 Sep 1 |
| Event | 2000 International Magnetics Conference (INTERMAG 2000) - Toronto, Ont, Canada Duration: 2000 Apr 9 → 2000 Apr 12 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
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Wu, J. C., Huang, H. W., & Wu, T. H. (2000). Evolution of magnetization reversal on patterned magnetic elements. IEEE Transactions on Magnetics, 36(5 I), 2978-2980. https://doi.org/10.1109/20.908646