Evolution of magnetization reversal on patterned magnetic elements

J. C. Wu; H. W. Huang; Te Ho Wu

doi:10.1109/20.908646

Evolution of magnetization reversal on patterned magnetic elements

J. C. Wu, H. W. Huang, Te Ho Wu

Department of Physics

Research output: Contribution to journal › Conference article › peer-review

8 Citations (Scopus)

Abstract

An in situ observation of magnetic domain structure evolution in the presence of an external magnetic field induced from a live current strip produced underneath patterned permalloy thin films is presented. The signal due to the electrostatic force was avoided during the magnetic force microscope imaging by adding an electrically grounded metal film in-between the patterned films and the current strip. Magnetization reversal on a 6 μm permalloy disk was imaged, whereas magnetic domain structure on higher aspect ratios of ellipse and rectangle permalloy elements showed great changes but a much higher field was required for magnetization saturation due to their high coercive and saturation fields.

Original language	English
Pages (from-to)	2978-2980
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	36
Issue number	5 I
DOIs	https://doi.org/10.1109/20.908646
Publication status	Published - 2000 Sep 1
Event	2000 International Magnetics Conference (INTERMAG 2000) - Toronto, Ont, Canada Duration: 2000 Apr 9 → 2000 Apr 12

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/20.908646

Fingerprint Dive into the research topics of 'Evolution of magnetization reversal on patterned magnetic elements'. Together they form a unique fingerprint.

Cite this

@article{5731173e8f0a44929841abd9b2165607,

title = "Evolution of magnetization reversal on patterned magnetic elements",

abstract = "An in situ observation of magnetic domain structure evolution in the presence of an external magnetic field induced from a live current strip produced underneath patterned permalloy thin films is presented. The signal due to the electrostatic force was avoided during the magnetic force microscope imaging by adding an electrically grounded metal film in-between the patterned films and the current strip. Magnetization reversal on a 6 μm permalloy disk was imaged, whereas magnetic domain structure on higher aspect ratios of ellipse and rectangle permalloy elements showed great changes but a much higher field was required for magnetization saturation due to their high coercive and saturation fields.",

author = "Wu, {J. C.} and Huang, {H. W.} and Wu, {Te Ho}",

year = "2000",

month = sep,

day = "1",

doi = "10.1109/20.908646",

language = "English",

volume = "36",

pages = "2978--2980",

journal = "IEEE Transactions on Magnetics",

issn = "0018-9464",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "5 I",

note = "2000 International Magnetics Conference (INTERMAG 2000) ; Conference date: 09-04-2000 Through 12-04-2000",

}

TY - JOUR

T1 - Evolution of magnetization reversal on patterned magnetic elements

AU - Wu, J. C.

AU - Huang, H. W.

AU - Wu, Te Ho

PY - 2000/9/1

Y1 - 2000/9/1

N2 - An in situ observation of magnetic domain structure evolution in the presence of an external magnetic field induced from a live current strip produced underneath patterned permalloy thin films is presented. The signal due to the electrostatic force was avoided during the magnetic force microscope imaging by adding an electrically grounded metal film in-between the patterned films and the current strip. Magnetization reversal on a 6 μm permalloy disk was imaged, whereas magnetic domain structure on higher aspect ratios of ellipse and rectangle permalloy elements showed great changes but a much higher field was required for magnetization saturation due to their high coercive and saturation fields.

AB - An in situ observation of magnetic domain structure evolution in the presence of an external magnetic field induced from a live current strip produced underneath patterned permalloy thin films is presented. The signal due to the electrostatic force was avoided during the magnetic force microscope imaging by adding an electrically grounded metal film in-between the patterned films and the current strip. Magnetization reversal on a 6 μm permalloy disk was imaged, whereas magnetic domain structure on higher aspect ratios of ellipse and rectangle permalloy elements showed great changes but a much higher field was required for magnetization saturation due to their high coercive and saturation fields.

UR - http://www.scopus.com/inward/record.url?scp=0034260734&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0034260734&partnerID=8YFLogxK

U2 - 10.1109/20.908646

DO - 10.1109/20.908646

M3 - Conference article

AN - SCOPUS:0034260734

VL - 36

SP - 2978

EP - 2980

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

SN - 0018-9464

IS - 5 I

T2 - 2000 International Magnetics Conference (INTERMAG 2000)

Y2 - 9 April 2000 through 12 April 2000

ER -