Evaluation of the variations of short-circuit capacities along a feeder due to distribution network upgrading

T. H. Chen, W. T. Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

The variations of short-circuit capacities (SCC's) along a feeder while a primary network is upgraded from original radial to normally closed-loop arrangement is essential for examining the protection system of the network after upgraded. The increments of SCC's along a feeder may cause the existing protection devices installed at the original network and its customers' distribution systems becoming inadequate. Hence, a simple, systematic and straightforward evaluation method is required, especially in the planning stage. To meet these requirements the short-circuit MVA method was adopted in this paper. Based on the adopted method, the variations of SCC's along a primary feeder before and after the network upgraded were represented by simple formulas and illustrated by figures that make the variations more easily be recognized. The results confirm that the short-circuit MVA method is quite suitable for evaluating the variations of SCC's along a feeder.

Original languageEnglish
Title of host publication2005 IEEE Power Engineering Society General Meeting
Pages2536-2541
Number of pages6
Publication statusPublished - 2005 Oct 31
Event2005 IEEE Power Engineering Society General Meeting - San Francisco, CA, United States
Duration: 2005 Jun 122005 Jun 16

Publication series

Name2005 IEEE Power Engineering Society General Meeting
Volume3

Other

Other2005 IEEE Power Engineering Society General Meeting
CountryUnited States
CitySan Francisco, CA
Period05-06-1205-06-16

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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    Chen, T. H., & Huang, W. T. (2005). Evaluation of the variations of short-circuit capacities along a feeder due to distribution network upgrading. In 2005 IEEE Power Engineering Society General Meeting (pp. 2536-2541). (2005 IEEE Power Engineering Society General Meeting; Vol. 3).