Erratum: “Retraction notice to Current Conduction Mechanism through Au/SnO/n-type Si/In Devices” [Thin Solid Films, 611 (2016) 1-5](S0040609016301432)(10.1016/j.tsf.2016.05.002)

Hou Yen Tsao, Yu-Wu Wang

Research output: Contribution to journalComment/debate

Abstract

This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the authors. Incorrect data was used in Figure 6 and 8. The data of Fig. 8 disclose the evidence of silicon elements diffusion at the interface that would affect the inference of whole paper. The authors apologize for any inconvenience caused.

Original languageEnglish
Number of pages1
JournalThin Solid Films
Volume665
DOIs
Publication statusPublished - 2018 Nov 1

Fingerprint

Silicon
conduction
inference
Industry
silicon

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

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title = "Erratum: “Retraction notice to Current Conduction Mechanism through Au/SnO/n-type Si/In Devices” [Thin Solid Films, 611 (2016) 1-5](S0040609016301432)(10.1016/j.tsf.2016.05.002)",
abstract = "This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the authors. Incorrect data was used in Figure 6 and 8. The data of Fig. 8 disclose the evidence of silicon elements diffusion at the interface that would affect the inference of whole paper. The authors apologize for any inconvenience caused.",
author = "Tsao, {Hou Yen} and Yu-Wu Wang",
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AU - Tsao, Hou Yen

AU - Wang, Yu-Wu

PY - 2018/11/1

Y1 - 2018/11/1

N2 - This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the authors. Incorrect data was used in Figure 6 and 8. The data of Fig. 8 disclose the evidence of silicon elements diffusion at the interface that would affect the inference of whole paper. The authors apologize for any inconvenience caused.

AB - This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the authors. Incorrect data was used in Figure 6 and 8. The data of Fig. 8 disclose the evidence of silicon elements diffusion at the interface that would affect the inference of whole paper. The authors apologize for any inconvenience caused.

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