Erratum: Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films (Applied Surface Science (2010) 256 (7623-7627))

Yow-Jon Lin; Mu Shan Wang; Chia-Jyi Liu; Hsueh Jung Huang

doi:10.1016/j.apsusc.2012.04.092

Erratum: Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films (Applied Surface Science (2010) 256 (7623-7627))

Yow-Jon Lin, Mu Shan Wang, Chia-Jyi Liu, Hsueh Jung Huang

Research output: Contribution to journal › Comment/debate

Original language	English
Number of pages	1
Journal	Applied Surface Science
Volume	258
Issue number	19
DOIs	https://doi.org/10.1016/j.apsusc.2012.04.092
Publication status	Published - 2012 Jul 15

All Science Journal Classification (ASJC) codes

Surfaces, Coatings and Films

Cite this

Lin, Y-J., Wang, M. S., Liu, C-J., & Huang, H. J. (2012). Erratum: Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films (Applied Surface Science (2010) 256 (7623-7627)). Applied Surface Science, 258(19). https://doi.org/10.1016/j.apsusc.2012.04.092

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Access to Document

10.1016/j.apsusc.2012.04.092