Erratum

Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films (Applied Surface Science (2010) 256 (7623-7627))

Yow-Jon Lin, Mu Shan Wang, Chia-Jyi Liu, Hsueh Jung Huang

Research output: Contribution to journalComment/debate

Original languageEnglish
Number of pages1
JournalApplied Surface Science
Volume258
Issue number19
DOIs
Publication statusPublished - 2012 Jul 15

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Diffraction
Defects

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

Cite this

@article{6152a1ce9431493ca58c0506c7423669,
title = "Erratum: Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films (Applied Surface Science (2010) 256 (7623-7627))",
author = "Yow-Jon Lin and Wang, {Mu Shan} and Chia-Jyi Liu and Huang, {Hsueh Jung}",
year = "2012",
month = "7",
day = "15",
doi = "10.1016/j.apsusc.2012.04.092",
language = "English",
volume = "258",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",
number = "19",

}

Erratum : Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films (Applied Surface Science (2010) 256 (7623-7627)). / Lin, Yow-Jon; Wang, Mu Shan; Liu, Chia-Jyi; Huang, Hsueh Jung.

In: Applied Surface Science, Vol. 258, No. 19, 15.07.2012.

Research output: Contribution to journalComment/debate

TY - JOUR

T1 - Erratum

T2 - Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films (Applied Surface Science (2010) 256 (7623-7627))

AU - Lin, Yow-Jon

AU - Wang, Mu Shan

AU - Liu, Chia-Jyi

AU - Huang, Hsueh Jung

PY - 2012/7/15

Y1 - 2012/7/15

UR - http://www.scopus.com/inward/record.url?scp=84861344434&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84861344434&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2012.04.092

DO - 10.1016/j.apsusc.2012.04.092

M3 - Comment/debate

VL - 258

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

IS - 19

ER -