Erratum: Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films (Applied Surface Science (2010) 256 (7623-7627))

Yow-Jon Lin; Mu Shan Wang; Chia-Jyi Liu; Hsueh Jung Huang

doi:10.1016/j.apsusc.2012.04.092

Erratum: Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films (Applied Surface Science (2010) 256 (7623-7627))

Yow-Jon Lin, Mu Shan Wang, Chia-Jyi Liu, Hsueh Jung Huang

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English
Number of pages	1
Journal	Applied Surface Science
Volume	258
Issue number	19
DOIs	https://doi.org/10.1016/j.apsusc.2012.04.092
Publication status	Published - 2012 Jul 15

All Science Journal Classification (ASJC) codes

Surfaces, Coatings and Films

Access to Document

10.1016/j.apsusc.2012.04.092

Cite this

@article{6152a1ce9431493ca58c0506c7423669,

title = "Erratum: Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films (Applied Surface Science (2010) 256 (7623-7627))",

author = "Yow-Jon Lin and Wang, {Mu Shan} and Chia-Jyi Liu and Huang, {Hsueh Jung}",

year = "2012",

month = jul,

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language = "English",

volume = "258",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier",

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AU - Lin, Yow-Jon

AU - Wang, Mu Shan

AU - Liu, Chia-Jyi

AU - Huang, Hsueh Jung

PY - 2012/7/15

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DO - 10.1016/j.apsusc.2012.04.092

M3 - Comment/debate

AN - SCOPUS:84861344434

VL - 258

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

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