Environmental effects on temperature-dependent carrier transports in poly(3-hexylthiophene) films

Yow Jon Lin, Yi Min Chin, Hsing Cheng Chang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Applications of poly(3-hexylthiophene) (P3HT) to solar cells have been reported. The reliability of organic solar cells is a key factor of full-scale applications in commercial optoelectronics. In this study, the environmental effect on the carrier transport in P3HT is researched. Charge-trapping phenomena are studied through time-domain measurement for P3HT thin-film transistors. The time-domain data confirm the hole-trapping model, indicating that water vapor influences the response by producing additional hole traps that serve to increase the current time constant. To understand the P3HT degradation mechanisms, an analysis through the temperature-dependent transfer characteristics is presented. It is shown that the hopping conduction behavior can be affected by exposure to ambient humidity and ambient atmosphere, inducing fluctuations in the hopping distance and the barrier height for hopping that serve to influence the carrier mobility.

Original languageEnglish
Pages (from-to)365-369
Number of pages5
JournalApplied Physics A: Materials Science and Processing
Volume119
Issue number1
DOIs
Publication statusPublished - 2015 Jan 1

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Carrier transport
Environmental impact
Hole traps
Charge trapping
Carrier mobility
Thin film transistors
Optoelectronic devices
Water vapor
Atmospheric humidity
Solar cells
Degradation
Temperature
Steam
poly(3-hexylthiophene)
Organic solar cells

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Science(all)

Cite this

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abstract = "Applications of poly(3-hexylthiophene) (P3HT) to solar cells have been reported. The reliability of organic solar cells is a key factor of full-scale applications in commercial optoelectronics. In this study, the environmental effect on the carrier transport in P3HT is researched. Charge-trapping phenomena are studied through time-domain measurement for P3HT thin-film transistors. The time-domain data confirm the hole-trapping model, indicating that water vapor influences the response by producing additional hole traps that serve to increase the current time constant. To understand the P3HT degradation mechanisms, an analysis through the temperature-dependent transfer characteristics is presented. It is shown that the hopping conduction behavior can be affected by exposure to ambient humidity and ambient atmosphere, inducing fluctuations in the hopping distance and the barrier height for hopping that serve to influence the carrier mobility.",
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Environmental effects on temperature-dependent carrier transports in poly(3-hexylthiophene) films. / Lin, Yow Jon; Chin, Yi Min; Chang, Hsing Cheng.

In: Applied Physics A: Materials Science and Processing, Vol. 119, No. 1, 01.01.2015, p. 365-369.

Research output: Contribution to journalArticle

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