Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of [Formula presented]

G. P. Zhang, T. A. Callcott, G. T. Woods, L. Lin, Brian Sales, D. Mandrus, J. He

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in [Formula presented]. In contrast to single photon techniques, RIXS at the vanadium [Formula presented] edge is able to probe [Formula presented] transitions between V [Formula presented]-bands. A sharp energy loss feature is observed at [Formula presented], which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term [Formula presented].

Original languageEnglish
Number of pages1
JournalPhysical Review Letters
Volume88
Issue number7
DOIs
Publication statusPublished - 2002 Jan 1

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scattering
electrons
x rays
x ray scattering
inelastic scattering
vanadium
spectroscopy
energy dissipation
probes
photons
excitation
interactions

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Zhang, G. P. ; Callcott, T. A. ; Woods, G. T. ; Lin, L. ; Sales, Brian ; Mandrus, D. ; He, J. / Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of [Formula presented]. In: Physical Review Letters. 2002 ; Vol. 88, No. 7.
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Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of [Formula presented]. / Zhang, G. P.; Callcott, T. A.; Woods, G. T.; Lin, L.; Sales, Brian; Mandrus, D.; He, J.

In: Physical Review Letters, Vol. 88, No. 7, 01.01.2002.

Research output: Contribution to journalArticle

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T1 - Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of [Formula presented]

AU - Zhang, G. P.

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AU - Sales, Brian

AU - Mandrus, D.

AU - He, J.

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AB - Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in [Formula presented]. In contrast to single photon techniques, RIXS at the vanadium [Formula presented] edge is able to probe [Formula presented] transitions between V [Formula presented]-bands. A sharp energy loss feature is observed at [Formula presented], which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term [Formula presented].

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