Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of [Formula presented]

G. P. Zhang; T. A. Callcott; G. T. Woods; L. Lin; Brian Sales; D. Mandrus; J. He

doi:10.1103/PhysRevLett.88.077401

Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of [Formula presented]

G. P. Zhang, T. A. Callcott, G. T. Woods, L. Lin, Brian Sales, D. Mandrus, J. He

Department of Physics

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in [Formula presented]. In contrast to single photon techniques, RIXS at the vanadium [Formula presented] edge is able to probe [Formula presented] transitions between V [Formula presented]-bands. A sharp energy loss feature is observed at [Formula presented], which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term [Formula presented].

Original language	English
Pages (from-to)	4
Number of pages	1
Journal	Physical Review Letters
Volume	88
Issue number	7
DOIs	https://doi.org/10.1103/PhysRevLett.88.077401
Publication status	Published - 2002

All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

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10.1103/PhysRevLett.88.077401

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title = "Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of [Formula presented]",

abstract = "Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in [Formula presented]. In contrast to single photon techniques, RIXS at the vanadium [Formula presented] edge is able to probe [Formula presented] transitions between V [Formula presented]-bands. A sharp energy loss feature is observed at [Formula presented], which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term [Formula presented].",

author = "Zhang, {G. P.} and Callcott, {T. A.} and Woods, {G. T.} and L. Lin and Brian Sales and D. Mandrus and J. He",

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T1 - Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of [Formula presented]

AU - Zhang, G. P.

AU - Callcott, T. A.

AU - Woods, G. T.

AU - Lin, L.

AU - Sales, Brian

AU - Mandrus, D.

AU - He, J.

PY - 2002

Y1 - 2002

N2 - Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in [Formula presented]. In contrast to single photon techniques, RIXS at the vanadium [Formula presented] edge is able to probe [Formula presented] transitions between V [Formula presented]-bands. A sharp energy loss feature is observed at [Formula presented], which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term [Formula presented].

AB - Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in [Formula presented]. In contrast to single photon techniques, RIXS at the vanadium [Formula presented] edge is able to probe [Formula presented] transitions between V [Formula presented]-bands. A sharp energy loss feature is observed at [Formula presented], which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term [Formula presented].

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