Abstract
Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in [Formula presented]. In contrast to single photon techniques, RIXS at the vanadium [Formula presented] edge is able to probe [Formula presented] transitions between V [Formula presented]-bands. A sharp energy loss feature is observed at [Formula presented], which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term [Formula presented].
| Original language | English |
|---|---|
| Number of pages | 1 |
| Journal | Physical Review Letters |
| Volume | 88 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 2002 Jan 1 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)
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Zhang, G. P., Callcott, T. A., Woods, G. T., Lin, L., Sales, B., Mandrus, D., & He, J. (2002). Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of [Formula presented]. Physical Review Letters, 88(7). https://doi.org/10.1103/PhysRevLett.88.077401