Electron Correlation Effects in Resonant Inelastic X-Ray Scattering of [Formula presented]

G. P. Zhang, T. A. Callcott, G. T. Woods, L. Lin, Brian Sales, D. Mandrus, J. He

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in [Formula presented]. In contrast to single photon techniques, RIXS at the vanadium [Formula presented] edge is able to probe [Formula presented] transitions between V [Formula presented]-bands. A sharp energy loss feature is observed at [Formula presented], which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term [Formula presented].

Original languageEnglish
Pages (from-to)4
Number of pages1
JournalPhysical Review Letters
Volume88
Issue number7
DOIs
Publication statusPublished - 2002

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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