Electrical and surface properties of SiO2 films modified by ultraviolet irradiation and used as gate dielectrics for pentacene thin-film transistor applications

Yow Jon Lin, Cheng Chun Hung, Jing Shiuan Huang, Sheng Yu Lin, Hsing Cheng Chang

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

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Physics & Astronomy