Effects of (NH 4 ) 2 S x treatment on surface work function and roughness of indium-tin-oxide

Yow-Jon Lin, Chang Feng You, Chia Lung Tsai

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

In this study, the effects of an (NH 4 ) 2 S x treatment on the surface work function (SWF) and roughness of indium-tin-oxide (ITO) have been investigated. From the observed X-ray photoelectron spectroscopy results, optical transmittance measurements, atomic force microscopy measurements and four-point probe measurements, it is suggested that the surface chemical changes and an increase in the sheet resistance had strong effects on the SWF of ITO. We find that the S occupation of oxygen vacancies near the ITO surface after (NH 4 ) 2 S x treatment may result in a marked increase in the SWF and a slight increase in the surface roughness.

Original languageEnglish
Pages (from-to)3957-3961
Number of pages5
JournalApplied Surface Science
Volume253
Issue number8
DOIs
Publication statusPublished - 2007 Feb 15

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

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