Abstract
This paper presents discrete wavelet transform (DWT) and short-time fourier transform (STFT) applications for different industrial applications. These two transforms have been compared in different fields, and their implementations are similar. The experiments and simulations show another aspect for both transforms in order to analyze the target information.
| Original language | English |
|---|---|
| Title of host publication | 2010 International Conference on System Science and Engineering, ICSSE 2010 |
| Pages | 31-35 |
| Number of pages | 5 |
| DOIs | |
| Publication status | Published - 2010 Oct 11 |
| Event | 2010 International Conference on System Science and Engineering, ICSSE 2010 - Taipei, Taiwan Duration: 2010 Jul 1 → 2010 Jul 3 |
Publication series
| Name | 2010 International Conference on System Science and Engineering, ICSSE 2010 |
|---|
Other
| Other | 2010 International Conference on System Science and Engineering, ICSSE 2010 |
|---|---|
| Country | Taiwan |
| City | Taipei |
| Period | 10-07-01 → 10-07-03 |
All Science Journal Classification (ASJC) codes
- Computational Theory and Mathematics
- Computer Science Applications
- Information Systems
- Control and Systems Engineering
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Cite this
Yang, W-R., & Yang, W. X. (2010). Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection. In 2010 International Conference on System Science and Engineering, ICSSE 2010 (pp. 31-35). [5551794] (2010 International Conference on System Science and Engineering, ICSSE 2010). https://doi.org/10.1109/ICSSE.2010.5551794