Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection

Wen-Ren Yang, Wen Xun Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

This paper presents discrete wavelet transform (DWT) and short-time fourier transform (STFT) applications for different industrial applications. These two transforms have been compared in different fields, and their implementations are similar. The experiments and simulations show another aspect for both transforms in order to analyze the target information.

Original languageEnglish
Title of host publication2010 International Conference on System Science and Engineering, ICSSE 2010
Pages31-35
Number of pages5
DOIs
Publication statusPublished - 2010 Oct 11
Event2010 International Conference on System Science and Engineering, ICSSE 2010 - Taipei, Taiwan
Duration: 2010 Jul 12010 Jul 3

Publication series

Name2010 International Conference on System Science and Engineering, ICSSE 2010

Other

Other2010 International Conference on System Science and Engineering, ICSSE 2010
CountryTaiwan
CityTaipei
Period10-07-0110-07-03

All Science Journal Classification (ASJC) codes

  • Computational Theory and Mathematics
  • Computer Science Applications
  • Information Systems
  • Control and Systems Engineering

Fingerprint Dive into the research topics of 'Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection'. Together they form a unique fingerprint.

  • Cite this

    Yang, W-R., & Yang, W. X. (2010). Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection. In 2010 International Conference on System Science and Engineering, ICSSE 2010 (pp. 31-35). [5551794] (2010 International Conference on System Science and Engineering, ICSSE 2010). https://doi.org/10.1109/ICSSE.2010.5551794