Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection

Wen-Ren Yang, Wen Xun Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

This paper presents discrete wavelet transform (DWT) and short-time fourier transform (STFT) applications for different industrial applications. These two transforms have been compared in different fields, and their implementations are similar. The experiments and simulations show another aspect for both transforms in order to analyze the target information.

Original languageEnglish
Title of host publication2010 International Conference on System Science and Engineering, ICSSE 2010
Pages31-35
Number of pages5
DOIs
Publication statusPublished - 2010 Oct 11
Event2010 International Conference on System Science and Engineering, ICSSE 2010 - Taipei, Taiwan
Duration: 2010 Jul 12010 Jul 3

Publication series

Name2010 International Conference on System Science and Engineering, ICSSE 2010

Other

Other2010 International Conference on System Science and Engineering, ICSSE 2010
CountryTaiwan
CityTaipei
Period10-07-0110-07-03

Fingerprint

Discrete wavelet transforms
Microcracks
Industrial applications
Fourier transforms
Electric potential
Experiments

All Science Journal Classification (ASJC) codes

  • Computational Theory and Mathematics
  • Computer Science Applications
  • Information Systems
  • Control and Systems Engineering

Cite this

Yang, W-R., & Yang, W. X. (2010). Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection. In 2010 International Conference on System Science and Engineering, ICSSE 2010 (pp. 31-35). [5551794] (2010 International Conference on System Science and Engineering, ICSSE 2010). https://doi.org/10.1109/ICSSE.2010.5551794
Yang, Wen-Ren ; Yang, Wen Xun. / Discrete wavelet transform and short-time fourier transform applications : Wafer microcrack and voltage sag detection. 2010 International Conference on System Science and Engineering, ICSSE 2010. 2010. pp. 31-35 (2010 International Conference on System Science and Engineering, ICSSE 2010).
@inproceedings{754fc4ed984f4f9cabd2b821647edc0b,
title = "Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection",
abstract = "This paper presents discrete wavelet transform (DWT) and short-time fourier transform (STFT) applications for different industrial applications. These two transforms have been compared in different fields, and their implementations are similar. The experiments and simulations show another aspect for both transforms in order to analyze the target information.",
author = "Wen-Ren Yang and Yang, {Wen Xun}",
year = "2010",
month = "10",
day = "11",
doi = "10.1109/ICSSE.2010.5551794",
language = "English",
isbn = "9781424464746",
series = "2010 International Conference on System Science and Engineering, ICSSE 2010",
pages = "31--35",
booktitle = "2010 International Conference on System Science and Engineering, ICSSE 2010",

}

Yang, W-R & Yang, WX 2010, Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection. in 2010 International Conference on System Science and Engineering, ICSSE 2010., 5551794, 2010 International Conference on System Science and Engineering, ICSSE 2010, pp. 31-35, 2010 International Conference on System Science and Engineering, ICSSE 2010, Taipei, Taiwan, 10-07-01. https://doi.org/10.1109/ICSSE.2010.5551794

Discrete wavelet transform and short-time fourier transform applications : Wafer microcrack and voltage sag detection. / Yang, Wen-Ren; Yang, Wen Xun.

2010 International Conference on System Science and Engineering, ICSSE 2010. 2010. p. 31-35 5551794 (2010 International Conference on System Science and Engineering, ICSSE 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Discrete wavelet transform and short-time fourier transform applications

T2 - Wafer microcrack and voltage sag detection

AU - Yang, Wen-Ren

AU - Yang, Wen Xun

PY - 2010/10/11

Y1 - 2010/10/11

N2 - This paper presents discrete wavelet transform (DWT) and short-time fourier transform (STFT) applications for different industrial applications. These two transforms have been compared in different fields, and their implementations are similar. The experiments and simulations show another aspect for both transforms in order to analyze the target information.

AB - This paper presents discrete wavelet transform (DWT) and short-time fourier transform (STFT) applications for different industrial applications. These two transforms have been compared in different fields, and their implementations are similar. The experiments and simulations show another aspect for both transforms in order to analyze the target information.

UR - http://www.scopus.com/inward/record.url?scp=77957596016&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77957596016&partnerID=8YFLogxK

U2 - 10.1109/ICSSE.2010.5551794

DO - 10.1109/ICSSE.2010.5551794

M3 - Conference contribution

AN - SCOPUS:77957596016

SN - 9781424464746

T3 - 2010 International Conference on System Science and Engineering, ICSSE 2010

SP - 31

EP - 35

BT - 2010 International Conference on System Science and Engineering, ICSSE 2010

ER -

Yang W-R, Yang WX. Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection. In 2010 International Conference on System Science and Engineering, ICSSE 2010. 2010. p. 31-35. 5551794. (2010 International Conference on System Science and Engineering, ICSSE 2010). https://doi.org/10.1109/ICSSE.2010.5551794