Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection

Wen-Ren Yang; Wen Xun Yang

doi:10.1109/ICSSE.2010.5551794

Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection

Wen-Ren Yang, Wen Xun Yang

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

Abstract

This paper presents discrete wavelet transform (DWT) and short-time fourier transform (STFT) applications for different industrial applications. These two transforms have been compared in different fields, and their implementations are similar. The experiments and simulations show another aspect for both transforms in order to analyze the target information.

Original language	English
Title of host publication	2010 International Conference on System Science and Engineering, ICSSE 2010
Pages	31-35
Number of pages	5
DOIs	https://doi.org/10.1109/ICSSE.2010.5551794
Publication status	Published - 2010 Oct 11
Event	2010 International Conference on System Science and Engineering, ICSSE 2010 - Taipei, Taiwan Duration: 2010 Jul 1 → 2010 Jul 3

Publication series

Name	2010 International Conference on System Science and Engineering, ICSSE 2010

Other

Other	2010 International Conference on System Science and Engineering, ICSSE 2010
Country	Taiwan
City	Taipei
Period	10-07-01 → 10-07-03

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All Science Journal Classification (ASJC) codes

Computational Theory and Mathematics
Computer Science Applications
Information Systems
Control and Systems Engineering

Cite this

Yang, W-R., & Yang, W. X. (2010). Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection. In 2010 International Conference on System Science and Engineering, ICSSE 2010 (pp. 31-35). [5551794] (2010 International Conference on System Science and Engineering, ICSSE 2010). https://doi.org/10.1109/ICSSE.2010.5551794

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Yang, W-R & Yang, WX 2010, Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection. in 2010 International Conference on System Science and Engineering, ICSSE 2010., 5551794, 2010 International Conference on System Science and Engineering, ICSSE 2010, pp. 31-35, 2010 International Conference on System Science and Engineering, ICSSE 2010, Taipei, Taiwan, 10-07-01. https://doi.org/10.1109/ICSSE.2010.5551794

Discrete wavelet transform and short-time fourier transform applications : Wafer microcrack and voltage sag detection. / Yang, Wen-Ren; Yang, Wen Xun.

2010 International Conference on System Science and Engineering, ICSSE 2010. 2010. p. 31-35 5551794 (2010 International Conference on System Science and Engineering, ICSSE 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Access to Document

10.1109/ICSSE.2010.5551794