Dependable embedded memory for intelligent systems

Yen Chieh Huang, Tsung-Chu Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Contiguity along Gray codes and neighborhood among cluster faults are naturally connected by a novel hypercube-based address remapping unit. A novel memory repair architecture based on redundant hypercube is proposed, which mainly consists of a modified ternary CAM with an address concentrator. A modified ESPRESSO tool is developed for redundancy analysis on clustered-fault repairing optimization. Based on the redundancy analysis for a two-dimensional Gray-code-ordered memory array, every clustered fault with a width of no more than w and a length of no more than l can be repaired by a single hypercube-based spare row with a degree of. Finally 100% of repair rate can be obtained using only a few equivalent rows.

Original languageEnglish
Title of host publicationIntelligent Technologies and Engineering Systems
Pages573-579
Number of pages7
DOIs
Publication statusPublished - 2013 Aug 8
Event2012 1st International Conference on Intelligent Technologies and Engineering Systems, ICITES 2012 - Changhua, Taiwan
Duration: 2012 Dec 132012 Dec 15

Publication series

NameLecture Notes in Electrical Engineering
Volume234 LNEE
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Other

Other2012 1st International Conference on Intelligent Technologies and Engineering Systems, ICITES 2012
CountryTaiwan
CityChanghua
Period12-12-1312-12-15

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All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering

Cite this

Huang, Y. C., & Huang, T-C. (2013). Dependable embedded memory for intelligent systems. In Intelligent Technologies and Engineering Systems (pp. 573-579). (Lecture Notes in Electrical Engineering; Vol. 234 LNEE). https://doi.org/10.1007/978-1-4614-6747-2_67