Defects, stress and abnormal shift of the (0 0 2) diffraction peak for Li-doped ZnO films

Yow-Jon Lin, Mu Shan Wang, Chia-Jyi Liu, Hsueh Jung Huang

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Abstract

The effect of changes in Li content on the structural property of sol-gel Li-doped ZnO films was investigated in this study. The observed changes of the Li incorporation-induced strain along c-axis are closely related to the different ratios between the concentrations of Li interstitials (Li i ) and Li substituting for Zn (Li Zn ) in the films. According to the observed results from X-ray diffraction (XRD) and photoluminescence measurements, we found that the domination of the dissociative mechanism in the Li-doped ZnO films led to transformation from Li Zn to Li i , involving the formation of Zn vacancies (V Zn ). In addition, the interaction between these defects (that is, Li Zn , Li i , V Zn and oxygen vacancy) and the crystal structure may lead to the abnormal shift of the (0 0 2) diffraction peak position determined from XRD measurements.

Original languageEnglish
Pages (from-to)7623-7627
Number of pages5
JournalApplied Surface Science
Volume256
Issue number24
DOIs
Publication statusPublished - 2010 Oct 1

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All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

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