Current-in-plane tunneling measurement through patterned contacts on top surfaces of magnetic tunnel junctions

Ching Ming Lee, Lin Xiu Ye, Jia Mou Lee, Yu Cyun Lin, Chao Yuan Huang, J. C. Wu, Masakiyo Tsunoda, Migaku Takahashi, Te ho Wu

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This study reports an alternative method for measuring the magnetoresistance of unpatterned magnetic tunnel junctions similar to the current-in-plane tunneling (CIPT) method. Instead of using microprobes, a series of point contacts with different spacings are coated on the top surface of the junctions and R-H loops at various spacings are then measured by the usual four-point probe method. The values of magnetoresistance and resistance-area products can be obtained by fitting the measured data to the CIPT theoretical model. The test results of two types of junctions were highly similar to those obtained from standard CIPT tools. The proposed method may help to accelerate the process for evaluating the quality of magnetic tunnel junctions when commercial CIPT tools are not accessible.

Original languageEnglish
Pages (from-to)169-172
Number of pages4
JournalJournal of Magnetics
Volume16
Issue number2
DOIs
Publication statusPublished - 2011 Jul 11

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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