Contactless electroreflectance and piezoreflectance of a two-dimensional electron gas at a GaN/AlGaN heterointerface

D. Y. Lin, Y. S. Huang, Y. F. Chen, K. K. Tiong

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We have measured the contactless electroreflectance and piezoreflectance spectra at 300 and 20 K from a GaN/AlGaN heterojunction structure grown by metalorganic chemical vapor deposition on 6H-SiC substrate. The features related to a two-dimensional electron gas confined at the GaN/ AlGaN heterojunction are observed and the origin and nature of these features are discussed.

Original languageEnglish
Pages (from-to)533-536
Number of pages4
JournalSolid State Communications
Issue number10
Publication statusPublished - 1998 Jul 29


All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

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