Comparison of Kretschmann-Raether configuration angular and thickness regimes with phase-difference shift for measuring changes in refractive index

Kun Huang Chen, Jing Heng Chen, Jiun-You Lin

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We derive the phase difference equation between the p- and s-polarizations of reflection light based on the Kretschmann-Raether configuration. This phase difference equation is used to examine the relationship of the incident angle and metal film thickness versus the phase differences under a small refractive index variation. For a fixed incident angle, the phase difference has a higher measurement sensitivity than the reflectivity change. At the critical angle, there is a higher sensitivity when the metal film thickness is smaller than the skin depth. The surface plasmon resonant (SPR) angle dominates when the metal film thickness is greater than the skin depth. The phase measuring sensitivity at the SPR angle is higher than that at the critical angle by 1 order.

Original languageEnglish
Article number023803
JournalOptical Engineering
Volume45
Issue number2
DOIs
Publication statusPublished - 2006 Feb 1

Fingerprint

Film thickness
Refractive index
Difference equations
refractivity
shift
Skin
configurations
Metals
metal films
Light reflection
film thickness
difference equations
Polarization
sensitivity
reflectance
polarization

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

Cite this

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Comparison of Kretschmann-Raether configuration angular and thickness regimes with phase-difference shift for measuring changes in refractive index. / Chen, Kun Huang; Chen, Jing Heng; Lin, Jiun-You.

In: Optical Engineering, Vol. 45, No. 2, 023803, 01.02.2006.

Research output: Contribution to journalArticle

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