Comment on "valence band offset of ZnOGaAs heterojunction measured by x-ray photoelectron spectroscopy" [Appl. Phys. Lett. 92, 012104 (2008)]

Research output: Contribution to journalComment/debate

3 Citations (Scopus)
Original languageEnglish
Article number046101
JournalApplied Physics Letters
Volume93
Issue number4
DOIs
Publication statusPublished - 2008 Aug 15

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x ray spectroscopy
heterojunctions
photoelectron spectroscopy
valence

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

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title = "Comment on {"}valence band offset of ZnOGaAs heterojunction measured by x-ray photoelectron spectroscopy{"} [Appl. Phys. Lett. 92, 012104 (2008)]",
author = "Yow-Jon Lin",
year = "2008",
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language = "English",
volume = "93",
journal = "Applied Physics Letters",
issn = "0003-6951",
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number = "4",

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