Comment on "unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy"[Appl. Phys. Lett. 86, 042104 (2005)]

Yow Jon Lin, Mercedes Gabás, Susana Gota, Joś Ramón Ramos-Barrado, Miguel Sánchez, Nicholas T. Barrett, Joś Avila, Maurizio Sacchi

Research output: Contribution to journal › Comment/debate

4 Citations (Scopus)
Original languageEnglish
Article number216101
Pages (from-to)1+1
JournalApplied Physics Letters
Volume86
Issue number21
DOIs
Publication statusPublished - 2005 May 23

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photoelectric emission
valence
conduction
spectroscopy
x rays

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Lin, Yow Jon ; Gabás, Mercedes ; Gota, Susana ; Ramos-Barrado, Joś Ramón ; Sánchez, Miguel ; Barrett, Nicholas T. ; Avila, Joś ; Sacchi, Maurizio. / Comment on "unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy"[Appl. Phys. Lett. 86, 042104 (2005)]. In: Applied Physics Letters. 2005 ; Vol. 86, No. 21. pp. 1+1.
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author = "Lin, {Yow Jon} and Mercedes Gab{\'a}s and Susana Gota and Ramos-Barrado, {Joś Ram{\'o}n} and Miguel S{\'a}nchez and Barrett, {Nicholas T.} and Joś Avila and Maurizio Sacchi",
year = "2005",
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Lin, YJ, Gabás, M, Gota, S, Ramos-Barrado, JR, Sánchez, M, Barrett, NT, Avila, J & Sacchi, M 2005, 'Comment on "unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy"[Appl. Phys. Lett. 86, 042104 (2005)]', Applied Physics Letters, vol. 86, no. 21, 216101, pp. 1+1. https://doi.org/10.1063/1.1935759

Comment on "unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy"[Appl. Phys. Lett. 86, 042104 (2005)]. / Lin, Yow Jon; Gabás, Mercedes; Gota, Susana; Ramos-Barrado, Joś Ramón; Sánchez, Miguel; Barrett, Nicholas T.; Avila, Joś; Sacchi, Maurizio.

In: Applied Physics Letters, Vol. 86, No. 21, 216101, 23.05.2005, p. 1+1.

Research output: Contribution to journal › Comment/debate

TY - JOUR

T1 - Comment on "unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy"[Appl. Phys. Lett. 86, 042104 (2005)]

AU - Lin, Yow Jon

AU - Gabás, Mercedes

AU - Gota, Susana

AU - Ramos-Barrado, Joś Ramón

AU - Sánchez, Miguel

AU - Barrett, Nicholas T.

AU - Avila, Joś

AU - Sacchi, Maurizio

PY - 2005/5/23

Y1 - 2005/5/23

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UR - http://www.scopus.com/inward/citedby.url?scp=20844436580&partnerID=8YFLogxK

U2 - 10.1063/1.1935759

DO - 10.1063/1.1935759

M3 - Comment/debate

AN - SCOPUS:20844436580

VL - 86

SP - 1+1

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 21

M1 - 216101

ER -

Lin YJ, Gabás M, Gota S, Ramos-Barrado JR, Sánchez M, Barrett NT et al. Comment on "unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy"[Appl. Phys. Lett. 86, 042104 (2005)]. Applied Physics Letters. 2005 May 23;86(21):1+1. 216101. https://doi.org/10.1063/1.1935759

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