Comment on "unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy"[Appl. Phys. Lett. 86, 042104 (2005)]

Yow Jon Lin, Mercedes Gabás, Susana Gota, Joś Ramón Ramos-Barrado, Miguel Sánchez, Nicholas T. Barrett, Joś Avila, Maurizio Sacchi

Research output: Contribution to journalComment/debate

4 Citations (Scopus)
Original languageEnglish
Article number216101
Pages (from-to)1+1
JournalApplied Physics Letters
Volume86
Issue number21
DOIs
Publication statusPublished - 2005 May 23

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photoelectric emission
valence
conduction
spectroscopy
x rays

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Lin, Yow Jon ; Gabás, Mercedes ; Gota, Susana ; Ramos-Barrado, Joś Ramón ; Sánchez, Miguel ; Barrett, Nicholas T. ; Avila, Joś ; Sacchi, Maurizio. / Comment on "unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy"[Appl. Phys. Lett. 86, 042104 (2005)]. In: Applied Physics Letters. 2005 ; Vol. 86, No. 21. pp. 1+1.
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Comment on "unraveling the conduction mechanism of Al-doped ZnO films by valence band soft x-ray photoemission spectroscopy"[Appl. Phys. Lett. 86, 042104 (2005)]. / Lin, Yow Jon; Gabás, Mercedes; Gota, Susana; Ramos-Barrado, Joś Ramón; Sánchez, Miguel; Barrett, Nicholas T.; Avila, Joś; Sacchi, Maurizio.

In: Applied Physics Letters, Vol. 86, No. 21, 216101, 23.05.2005, p. 1+1.

Research output: Contribution to journalComment/debate

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AU - Lin, Yow Jon

AU - Gabás, Mercedes

AU - Gota, Susana

AU - Ramos-Barrado, Joś Ramón

AU - Sánchez, Miguel

AU - Barrett, Nicholas T.

AU - Avila, Joś

AU - Sacchi, Maurizio

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