Comment on "mechanism for the increase of indium-tin-oxide work function by O2 inductively coupled plasma treatment" [J. Appl. Phys. 95, 586 (2004)]

Research output: Contribution to journalReview article

Abstract

A high work function on indium tin oxide (ITO) surfaces with O2 inductively coupled plasma (ICP) treatment was obtained in the paper: "Mechanism for the increase of indium tin oxide work function by O2 inductively coupled plasma treatment" [Lee, J. Appl. Phys. 95, 586 (2004)]. They attributed this to the higher work function of the larger upward band bending and the larger electron affinity of the ITO near the surface by the ICP treatment. In this Comment, we indicate the mistake in their analysis of the observed result by synchrotron radiation photoemission spectroscopy.

Original languageEnglish
Article number036104
JournalJournal of Applied Physics
Volume101
Issue number3
DOIs
Publication statusPublished - 2007 Feb 26

Fingerprint

indium oxides
tin oxides
electron affinity
synchrotron radiation
photoelectric emission
spectroscopy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Cite this

@article{9555faf49079407c9b440b302e051d29,
title = "Comment on {"}mechanism for the increase of indium-tin-oxide work function by O2 inductively coupled plasma treatment{"} [J. Appl. Phys. 95, 586 (2004)]",
abstract = "A high work function on indium tin oxide (ITO) surfaces with O2 inductively coupled plasma (ICP) treatment was obtained in the paper: {"}Mechanism for the increase of indium tin oxide work function by O2 inductively coupled plasma treatment{"} [Lee, J. Appl. Phys. 95, 586 (2004)]. They attributed this to the higher work function of the larger upward band bending and the larger electron affinity of the ITO near the surface by the ICP treatment. In this Comment, we indicate the mistake in their analysis of the observed result by synchrotron radiation photoemission spectroscopy.",
author = "Yow-Jon Lin",
year = "2007",
month = "2",
day = "26",
doi = "10.1063/1.2432301",
language = "English",
volume = "101",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "3",

}

TY - JOUR

T1 - Comment on "mechanism for the increase of indium-tin-oxide work function by O2 inductively coupled plasma treatment" [J. Appl. Phys. 95, 586 (2004)]

AU - Lin, Yow-Jon

PY - 2007/2/26

Y1 - 2007/2/26

N2 - A high work function on indium tin oxide (ITO) surfaces with O2 inductively coupled plasma (ICP) treatment was obtained in the paper: "Mechanism for the increase of indium tin oxide work function by O2 inductively coupled plasma treatment" [Lee, J. Appl. Phys. 95, 586 (2004)]. They attributed this to the higher work function of the larger upward band bending and the larger electron affinity of the ITO near the surface by the ICP treatment. In this Comment, we indicate the mistake in their analysis of the observed result by synchrotron radiation photoemission spectroscopy.

AB - A high work function on indium tin oxide (ITO) surfaces with O2 inductively coupled plasma (ICP) treatment was obtained in the paper: "Mechanism for the increase of indium tin oxide work function by O2 inductively coupled plasma treatment" [Lee, J. Appl. Phys. 95, 586 (2004)]. They attributed this to the higher work function of the larger upward band bending and the larger electron affinity of the ITO near the surface by the ICP treatment. In this Comment, we indicate the mistake in their analysis of the observed result by synchrotron radiation photoemission spectroscopy.

UR - http://www.scopus.com/inward/record.url?scp=33847141370&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33847141370&partnerID=8YFLogxK

U2 - 10.1063/1.2432301

DO - 10.1063/1.2432301

M3 - Review article

AN - SCOPUS:33847141370

VL - 101

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 3

M1 - 036104

ER -