Comment on "Interpretation of Fermi level pinning on 4H-SiC using synchrotron photoemission spectroscopy" [Appl. Phys. Lett. 84, 538 (2004)]

Yow-Jon Lin, Chih Kuo Tseng, Sang Youn Han, Jong Lam Lee

Research output: Contribution to journal › Comment/debate

Original languageEnglish
Pages (from-to)2661-2664
Number of pages4
JournalApplied Physics Letters
Volume85
Issue number13
DOIs
Publication statusPublished - 2004 Sep 27

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synchrotrons
photoelectric emission
spectroscopy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Lin, Yow-Jon ; Tseng, Chih Kuo ; Han, Sang Youn ; Lee, Jong Lam. / Comment on "Interpretation of Fermi level pinning on 4H-SiC using synchrotron photoemission spectroscopy" [Appl. Phys. Lett. 84, 538 (2004)]. In: Applied Physics Letters. 2004 ; Vol. 85, No. 13. pp. 2661-2664.
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author = "Yow-Jon Lin and Tseng, {Chih Kuo} and Han, {Sang Youn} and Lee, {Jong Lam}",
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Lin, Y-J, Tseng, CK, Han, SY & Lee, JL 2004, 'Comment on "Interpretation of Fermi level pinning on 4H-SiC using synchrotron photoemission spectroscopy" [Appl. Phys. Lett. 84, 538 (2004)]', Applied Physics Letters, vol. 85, no. 13, pp. 2661-2664. https://doi.org/10.1063/1.1795355

Comment on "Interpretation of Fermi level pinning on 4H-SiC using synchrotron photoemission spectroscopy" [Appl. Phys. Lett. 84, 538 (2004)]. / Lin, Yow-Jon; Tseng, Chih Kuo; Han, Sang Youn; Lee, Jong Lam.

In: Applied Physics Letters, Vol. 85, No. 13, 27.09.2004, p. 2661-2664.

Research output: Contribution to journal › Comment/debate

TY - JOUR

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AU - Lin, Yow-Jon

AU - Tseng, Chih Kuo

AU - Han, Sang Youn

AU - Lee, Jong Lam

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Lin Y-J, Tseng CK, Han SY, Lee JL. Comment on "Interpretation of Fermi level pinning on 4H-SiC using synchrotron photoemission spectroscopy" [Appl. Phys. Lett. 84, 538 (2004)]. Applied Physics Letters. 2004 Sep 27;85(13):2661-2664. https://doi.org/10.1063/1.1795355

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