Comment on "Interpretation of Fermi level pinning on 4H-SiC using synchrotron photoemission spectroscopy" [Appl. Phys. Lett. 84, 538 (2004)]

Yow-Jon Lin, Chih Kuo Tseng, Sang Youn Han, Jong Lam Lee

Research output: Contribution to journalComment/debate

Original languageEnglish
Pages (from-to)2661-2664
Number of pages4
JournalApplied Physics Letters
Volume85
Issue number13
DOIs
Publication statusPublished - 2004 Sep 27

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synchrotrons
photoelectric emission
spectroscopy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

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title = "Comment on {"}Interpretation of Fermi level pinning on 4H-SiC using synchrotron photoemission spectroscopy{"} [Appl. Phys. Lett. 84, 538 (2004)]",
author = "Yow-Jon Lin and Tseng, {Chih Kuo} and Han, {Sang Youn} and Lee, {Jong Lam}",
year = "2004",
month = "9",
day = "27",
doi = "10.1063/1.1795355",
language = "English",
volume = "85",
pages = "2661--2664",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "13",

}

Comment on "Interpretation of Fermi level pinning on 4H-SiC using synchrotron photoemission spectroscopy" [Appl. Phys. Lett. 84, 538 (2004)]. / Lin, Yow-Jon; Tseng, Chih Kuo; Han, Sang Youn; Lee, Jong Lam.

In: Applied Physics Letters, Vol. 85, No. 13, 27.09.2004, p. 2661-2664.

Research output: Contribution to journalComment/debate

TY - JOUR

T1 - Comment on "Interpretation of Fermi level pinning on 4H-SiC using synchrotron photoemission spectroscopy" [Appl. Phys. Lett. 84, 538 (2004)]

AU - Lin, Yow-Jon

AU - Tseng, Chih Kuo

AU - Han, Sang Youn

AU - Lee, Jong Lam

PY - 2004/9/27

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U2 - 10.1063/1.1795355

DO - 10.1063/1.1795355

M3 - Comment/debate

AN - SCOPUS:7544243299

VL - 85

SP - 2661

EP - 2664

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 13

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