Comment on "influence of indium-tin-oxide thin-film quality on reverse leakage current of indium-tin-oxide/n-GaN Schottky contacts" [ Appl. Phys. Lett. 89, 033503 (2006)]

Yow Jon Lin, Chia Lung Tsai, Day Shan Liu

Research output: Contribution to journalComment/debate

1 Citation (Scopus)
Original languageEnglish
Article number046101
JournalApplied Physics Letters
Volume90
Issue number4
DOIs
Publication statusPublished - 2007 Feb 5

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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