Original language | English |
---|---|
Article number | 046101 |
Journal | Applied Physics Letters |
Volume | 90 |
Issue number | 4 |
DOIs |
|
Publication status | Published - 2007 Feb 5 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)
Cite this
}
Comment on "influence of indium-tin-oxide thin-film quality on reverse leakage current of indium-tin-oxide/n-GaN Schottky contacts" [ Appl. Phys. Lett. 89, 033503 (2006)]. / Lin, Yow-Jon; Tsai, Chia Lung; Liu, Day Shan.
In: Applied Physics Letters, Vol. 90, No. 4, 046101, 05.02.2007.Research output: Contribution to journal › Comment/debate
TY - JOUR
T1 - Comment on "influence of indium-tin-oxide thin-film quality on reverse leakage current of indium-tin-oxide/n-GaN Schottky contacts" [ Appl. Phys. Lett. 89, 033503 (2006)]
AU - Lin, Yow-Jon
AU - Tsai, Chia Lung
AU - Liu, Day Shan
PY - 2007/2/5
Y1 - 2007/2/5
UR - http://www.scopus.com/inward/record.url?scp=33846580613&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33846580613&partnerID=8YFLogxK
U2 - 10.1063/1.2435354
DO - 10.1063/1.2435354
M3 - Comment/debate
AN - SCOPUS:33846580613
VL - 90
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 4
M1 - 046101
ER -