Comment on "depletion width measurement in an organic Schottky contact using a metal-semiconductor field-effect transistor" [Appl. Phys. Lett. 91, 083513 (2007)]

Yow Jon Lin

doi:10.1063/1.3475395

Comment on "depletion width measurement in an organic Schottky contact using a metal-semiconductor field-effect transistor" [Appl. Phys. Lett. 91, 083513 (2007)]

Graduate Institute of Photonics

Research output: Contribution to journal › Comment/debate

Original language	English
Article number	096101
Journal	Applied Physics Letters
Volume	97
Issue number	9
DOIs	https://doi.org/10.1063/1.3475395
Publication status	Published - 2010 Aug 30

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.3475395

Cite this

Lin, Y. J. (2010). Comment on "depletion width measurement in an organic Schottky contact using a metal-semiconductor field-effect transistor" [Appl. Phys. Lett. 91, 083513 (2007)]. Applied Physics Letters, 97(9), [096101]. https://doi.org/10.1063/1.3475395

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