Comment on "depletion width measurement in an organic Schottky contact using a metal-semiconductor field-effect transistor" [Appl. Phys. Lett. 91, 083513 (2007)]

Research output: Contribution to journalComment/debate

Original languageEnglish
Article number096101
JournalApplied Physics Letters
Volume97
Issue number9
DOIs
Publication statusPublished - 2010 Aug 30

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electric contacts
depletion
field effect transistors
metals

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

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title = "Comment on {"}depletion width measurement in an organic Schottky contact using a metal-semiconductor field-effect transistor{"} [Appl. Phys. Lett. 91, 083513 (2007)]",
author = "Yow-Jon Lin",
year = "2010",
month = "8",
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language = "English",
volume = "97",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "9",

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