Cluster error correction and on-line repair for real-time TSV array

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

As a high-speed circuit-level real-time channel through-silicon vias admit only several levels of logic gates for correcting and repairing within a clock cycle. Unfortunately they are usually arranged as a crowded array for floorplanning and manufacturing reasons. To repair cluster faults and correct cluster errors, in this paper a complete strategy with a fast and adaptive architecture is proposed for built-in self-repairing, correcting and monitoring. The strategy includes off-line built-in self-test/repair and on-line correction, monitoring and repair. An LFSR-based noisy channel emulator is developed for verifying the architecture and evaluating the performance in a magnified probabilistic model. A conditional probability based cluster error model is also developed for analyzing the MTTR and BLER analyses posteriori to the AWGN noise. Evaluations prove that the proposed architecture can be effectively and efficiently suitable for hybrid memory cube to test, repair, detect, correct and monitor a large cluster error almost within a nano-second.

Original languageEnglish
Title of host publicationProceedings of the 6th Asia Symposium on Quality Electronic Design, ASQED 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages132-137
Number of pages6
ISBN (Electronic)9781467374958
DOIs
Publication statusPublished - 2015 Sep 21
Event6th Asia Symposium on Quality Electronic Design, ASQED 2015 - Kuala Lumpur, Malaysia
Duration: 2015 Aug 42015 Aug 5

Other

Other6th Asia Symposium on Quality Electronic Design, ASQED 2015
CountryMalaysia
CityKuala Lumpur
Period15-08-0415-08-05

Fingerprint

Error correction
Repair
Built-in self test
Logic gates
Monitoring
Clocks
Data storage equipment
Silicon
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Huang, T. C. (2015). Cluster error correction and on-line repair for real-time TSV array. In Proceedings of the 6th Asia Symposium on Quality Electronic Design, ASQED 2015 (pp. 132-137). [7274022] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ACQED.2015.7274022
Huang, Tsung Chu. / Cluster error correction and on-line repair for real-time TSV array. Proceedings of the 6th Asia Symposium on Quality Electronic Design, ASQED 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 132-137
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Huang, TC 2015, Cluster error correction and on-line repair for real-time TSV array. in Proceedings of the 6th Asia Symposium on Quality Electronic Design, ASQED 2015., 7274022, Institute of Electrical and Electronics Engineers Inc., pp. 132-137, 6th Asia Symposium on Quality Electronic Design, ASQED 2015, Kuala Lumpur, Malaysia, 15-08-04. https://doi.org/10.1109/ACQED.2015.7274022

Cluster error correction and on-line repair for real-time TSV array. / Huang, Tsung Chu.

Proceedings of the 6th Asia Symposium on Quality Electronic Design, ASQED 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 132-137 7274022.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Huang TC. Cluster error correction and on-line repair for real-time TSV array. In Proceedings of the 6th Asia Symposium on Quality Electronic Design, ASQED 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 132-137. 7274022 https://doi.org/10.1109/ACQED.2015.7274022