Abstract
In this letter, the situation when the barriers are partially p-doped in selected regions is considered in order to avoid the diffusion of Mg into the quantum well during crystal growth. Moreover, to increase the hole injection and improve the carrier distribution across the multiple quantum wells, the three barriers near the p-layers are p-doped with a gradually increased doping concentration in a blue InGaN light-emitting diode. According to the simulation results, when the stepwise p-doping profile is used in the selected barrier regions, the output power and internal quantum efficiency markedly improve due to the increased hole injection efficiency and decreased electron leakage.
| Original language | English |
|---|---|
| Article number | 5378628 |
| Pages (from-to) | 374-376 |
| Number of pages | 3 |
| Journal | IEEE Photonics Technology Letters |
| Volume | 22 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2010 Mar 15 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
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Cite this
Tsai, M. C., Yen, S. H., & Kuo, Y-K. (2010). Carrier transportation and internal quantum efficiency of blue inGaN light-emitting diodes with P-Doped Barriers. IEEE Photonics Technology Letters, 22(6), 374-376. [5378628]. https://doi.org/10.1109/LPT.2010.2040075