Built-in current sensor designs based on the bulk-driven technique

Tsung-Chu Huang, Min Cheng Huang, Kuen Jong Lee

Research output: Contribution to journalConference article

6 Citations (Scopus)

Abstract

Recently the bulk-driven current mirror technique has been employed in built-in current sensors for low voltage environment. This paper proposes 4 arrangements of built-in current sensors based on this technique. They are mainly different in biasing schemes and respectively take the advantages of simplicity, accuracy, flexibility and low power dissipation. From experiments, these sensors have small performance impact which causes only 0.3 V of power supply voltage drop and 0.3 ns delay of circuit speed degradation. These sensors require single external power supply and small area overhead.

Original languageEnglish
Pages (from-to)384-388
Number of pages5
JournalProceedings of the Asian Test Symposium
Publication statusPublished - 1997 Dec 1
EventProceedings of the 1997 6th Asian Test Symposium - Akita, Jpn
Duration: 1997 Nov 171997 Nov 19

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Sensors
Energy dissipation
Mirrors
Degradation
Networks (circuits)
Electric potential
Experiments
Voltage drop

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

@article{5b502dcff1b7499f87838ab01283411a,
title = "Built-in current sensor designs based on the bulk-driven technique",
abstract = "Recently the bulk-driven current mirror technique has been employed in built-in current sensors for low voltage environment. This paper proposes 4 arrangements of built-in current sensors based on this technique. They are mainly different in biasing schemes and respectively take the advantages of simplicity, accuracy, flexibility and low power dissipation. From experiments, these sensors have small performance impact which causes only 0.3 V of power supply voltage drop and 0.3 ns delay of circuit speed degradation. These sensors require single external power supply and small area overhead.",
author = "Tsung-Chu Huang and Huang, {Min Cheng} and Lee, {Kuen Jong}",
year = "1997",
month = "12",
day = "1",
language = "English",
pages = "384--388",
journal = "Proceedings of the Asian Test Symposium",
issn = "1081-7735",
publisher = "IEEE Computer Society",

}

Built-in current sensor designs based on the bulk-driven technique. / Huang, Tsung-Chu; Huang, Min Cheng; Lee, Kuen Jong.

In: Proceedings of the Asian Test Symposium, 01.12.1997, p. 384-388.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Built-in current sensor designs based on the bulk-driven technique

AU - Huang, Tsung-Chu

AU - Huang, Min Cheng

AU - Lee, Kuen Jong

PY - 1997/12/1

Y1 - 1997/12/1

N2 - Recently the bulk-driven current mirror technique has been employed in built-in current sensors for low voltage environment. This paper proposes 4 arrangements of built-in current sensors based on this technique. They are mainly different in biasing schemes and respectively take the advantages of simplicity, accuracy, flexibility and low power dissipation. From experiments, these sensors have small performance impact which causes only 0.3 V of power supply voltage drop and 0.3 ns delay of circuit speed degradation. These sensors require single external power supply and small area overhead.

AB - Recently the bulk-driven current mirror technique has been employed in built-in current sensors for low voltage environment. This paper proposes 4 arrangements of built-in current sensors based on this technique. They are mainly different in biasing schemes and respectively take the advantages of simplicity, accuracy, flexibility and low power dissipation. From experiments, these sensors have small performance impact which causes only 0.3 V of power supply voltage drop and 0.3 ns delay of circuit speed degradation. These sensors require single external power supply and small area overhead.

UR - http://www.scopus.com/inward/record.url?scp=0031373423&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031373423&partnerID=8YFLogxK

M3 - Conference article

SP - 384

EP - 388

JO - Proceedings of the Asian Test Symposium

JF - Proceedings of the Asian Test Symposium

SN - 1081-7735

ER -