Band bending at the conducting polymer/indium tin oxide interfaces with and without ultraviolet treatment

Yow-Jon Lin, Yi Min Chin, Jung Chung Lin, Yu Chao Su

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

In this study, the effect of ultraviolet treatment on the band bending at the poly(3,4-ethylenedioxythiophene) doped with poly(4-styrenesulfonate)/indium tin oxide (PEDOT:PSS/ITO) interfaces were researched. The authors suggested that ultraviolet treatment could lead to a reduction in the band bending at the PEDOT:PSS/ITO interface, owing to the removal of carbon contamination at the ITO surfaces and a decrease in the number of the trap-states at the PEDOT:PSS/ITO interface.

Original languageEnglish
Pages (from-to)6259-6261
Number of pages3
JournalApplied Surface Science
Volume256
Issue number21
DOIs
Publication statusPublished - 2010 Aug 15

Fingerprint

Conducting polymers
Tin oxides
Indium
Contamination
Carbon
poly(3,4-ethylene dioxythiophene)
indium tin oxide

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

Cite this

Lin, Yow-Jon ; Chin, Yi Min ; Lin, Jung Chung ; Su, Yu Chao. / Band bending at the conducting polymer/indium tin oxide interfaces with and without ultraviolet treatment. In: Applied Surface Science. 2010 ; Vol. 256, No. 21. pp. 6259-6261.
@article{948ca08252944930b9cc7e302c0e1fcc,
title = "Band bending at the conducting polymer/indium tin oxide interfaces with and without ultraviolet treatment",
abstract = "In this study, the effect of ultraviolet treatment on the band bending at the poly(3,4-ethylenedioxythiophene) doped with poly(4-styrenesulfonate)/indium tin oxide (PEDOT:PSS/ITO) interfaces were researched. The authors suggested that ultraviolet treatment could lead to a reduction in the band bending at the PEDOT:PSS/ITO interface, owing to the removal of carbon contamination at the ITO surfaces and a decrease in the number of the trap-states at the PEDOT:PSS/ITO interface.",
author = "Yow-Jon Lin and Chin, {Yi Min} and Lin, {Jung Chung} and Su, {Yu Chao}",
year = "2010",
month = "8",
day = "15",
doi = "10.1016/j.apsusc.2010.03.151",
language = "English",
volume = "256",
pages = "6259--6261",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",
number = "21",

}

Band bending at the conducting polymer/indium tin oxide interfaces with and without ultraviolet treatment. / Lin, Yow-Jon; Chin, Yi Min; Lin, Jung Chung; Su, Yu Chao.

In: Applied Surface Science, Vol. 256, No. 21, 15.08.2010, p. 6259-6261.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Band bending at the conducting polymer/indium tin oxide interfaces with and without ultraviolet treatment

AU - Lin, Yow-Jon

AU - Chin, Yi Min

AU - Lin, Jung Chung

AU - Su, Yu Chao

PY - 2010/8/15

Y1 - 2010/8/15

N2 - In this study, the effect of ultraviolet treatment on the band bending at the poly(3,4-ethylenedioxythiophene) doped with poly(4-styrenesulfonate)/indium tin oxide (PEDOT:PSS/ITO) interfaces were researched. The authors suggested that ultraviolet treatment could lead to a reduction in the band bending at the PEDOT:PSS/ITO interface, owing to the removal of carbon contamination at the ITO surfaces and a decrease in the number of the trap-states at the PEDOT:PSS/ITO interface.

AB - In this study, the effect of ultraviolet treatment on the band bending at the poly(3,4-ethylenedioxythiophene) doped with poly(4-styrenesulfonate)/indium tin oxide (PEDOT:PSS/ITO) interfaces were researched. The authors suggested that ultraviolet treatment could lead to a reduction in the band bending at the PEDOT:PSS/ITO interface, owing to the removal of carbon contamination at the ITO surfaces and a decrease in the number of the trap-states at the PEDOT:PSS/ITO interface.

UR - http://www.scopus.com/inward/record.url?scp=77953134114&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77953134114&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2010.03.151

DO - 10.1016/j.apsusc.2010.03.151

M3 - Article

VL - 256

SP - 6259

EP - 6261

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

IS - 21

ER -