Abstract
In this paper, we present a PC-based automatic measurement system for measuring the junction temperatures of light-emitting diodes (LEDs) operated at different forward currents. This system is described in three major parts: (1) screen panel and function design of control software (2) data acquisition and heating hardware (3) system integration and function test. In order to check and demonstrate its performance, the junction temperatures of three InGaN/GaN multiquantum well (MQW) LEDs have been performed by this system. The operating currents are reported in the range of 10-300 mA and the measured junction temperatures are obtained from 30 to 200 °C.
Original language | English |
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Title of host publication | 3CA 2010 - 2010 International Symposium on Computer, Communication, Control and Automation |
Pages | 276-279 |
Number of pages | 4 |
Volume | 1 |
DOIs | |
Publication status | Published - 2010 Sep 3 |
Event | 2010 International Symposium on Computer, Communication, Control and Automation, 3CA 2010 - Tainan, Taiwan Duration: 2010 May 5 → 2010 May 7 |
Other
Other | 2010 International Symposium on Computer, Communication, Control and Automation, 3CA 2010 |
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Country | Taiwan |
City | Tainan |
Period | 10-05-05 → 10-05-07 |
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All Science Journal Classification (ASJC) codes
- Computer Networks and Communications
- Hardware and Architecture
- Control and Systems Engineering
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Automatic measurement system for junction temperature of light emitting diodes. / Kuo, C. L.; Lin, Der-Yuh.
3CA 2010 - 2010 International Symposium on Computer, Communication, Control and Automation. Vol. 1 2010. p. 276-279 5533832.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Automatic measurement system for junction temperature of light emitting diodes
AU - Kuo, C. L.
AU - Lin, Der-Yuh
PY - 2010/9/3
Y1 - 2010/9/3
N2 - In this paper, we present a PC-based automatic measurement system for measuring the junction temperatures of light-emitting diodes (LEDs) operated at different forward currents. This system is described in three major parts: (1) screen panel and function design of control software (2) data acquisition and heating hardware (3) system integration and function test. In order to check and demonstrate its performance, the junction temperatures of three InGaN/GaN multiquantum well (MQW) LEDs have been performed by this system. The operating currents are reported in the range of 10-300 mA and the measured junction temperatures are obtained from 30 to 200 °C.
AB - In this paper, we present a PC-based automatic measurement system for measuring the junction temperatures of light-emitting diodes (LEDs) operated at different forward currents. This system is described in three major parts: (1) screen panel and function design of control software (2) data acquisition and heating hardware (3) system integration and function test. In order to check and demonstrate its performance, the junction temperatures of three InGaN/GaN multiquantum well (MQW) LEDs have been performed by this system. The operating currents are reported in the range of 10-300 mA and the measured junction temperatures are obtained from 30 to 200 °C.
UR - http://www.scopus.com/inward/record.url?scp=77956124995&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77956124995&partnerID=8YFLogxK
U2 - 10.1109/3CA.2010.5533832
DO - 10.1109/3CA.2010.5533832
M3 - Conference contribution
AN - SCOPUS:77956124995
SN - 9781424455669
VL - 1
SP - 276
EP - 279
BT - 3CA 2010 - 2010 International Symposium on Computer, Communication, Control and Automation
ER -