Automatic measurement system for junction temperature of light emitting diodes

C. L. Kuo; Der-Yuh Lin

doi:10.1109/3CA.2010.5533832

Automatic measurement system for junction temperature of light emitting diodes

C. L. Kuo, Der-Yuh Lin

Department of Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In this paper, we present a PC-based automatic measurement system for measuring the junction temperatures of light-emitting diodes (LEDs) operated at different forward currents. This system is described in three major parts: (1) screen panel and function design of control software (2) data acquisition and heating hardware (3) system integration and function test. In order to check and demonstrate its performance, the junction temperatures of three InGaN/GaN multiquantum well (MQW) LEDs have been performed by this system. The operating currents are reported in the range of 10-300 mA and the measured junction temperatures are obtained from 30 to 200 °C.

Original language	English
Title of host publication	3CA 2010 - 2010 International Symposium on Computer, Communication, Control and Automation
Pages	276-279
Number of pages	4
Volume	1
DOIs	https://doi.org/10.1109/3CA.2010.5533832
Publication status	Published - 2010 Sep 3
Event	2010 International Symposium on Computer, Communication, Control and Automation, 3CA 2010 - Tainan, Taiwan Duration: 2010 May 5 → 2010 May 7

Other

Other	2010 International Symposium on Computer, Communication, Control and Automation, 3CA 2010
Country	Taiwan
City	Tainan
Period	10-05-05 → 10-05-07

All Science Journal Classification (ASJC) codes

Computer Networks and Communications
Hardware and Architecture
Control and Systems Engineering

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10.1109/3CA.2010.5533832

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Cite this

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title = "Automatic measurement system for junction temperature of light emitting diodes",

abstract = "In this paper, we present a PC-based automatic measurement system for measuring the junction temperatures of light-emitting diodes (LEDs) operated at different forward currents. This system is described in three major parts: (1) screen panel and function design of control software (2) data acquisition and heating hardware (3) system integration and function test. In order to check and demonstrate its performance, the junction temperatures of three InGaN/GaN multiquantum well (MQW) LEDs have been performed by this system. The operating currents are reported in the range of 10-300 mA and the measured junction temperatures are obtained from 30 to 200 °C.",

author = "Kuo, {C. L.} and Der-Yuh Lin",

year = "2010",

month = sep,

day = "3",

doi = "10.1109/3CA.2010.5533832",

language = "English",

isbn = "9781424455669",

volume = "1",

pages = "276--279",

booktitle = "3CA 2010 - 2010 International Symposium on Computer, Communication, Control and Automation",

note = "2010 International Symposium on Computer, Communication, Control and Automation, 3CA 2010 ; Conference date: 05-05-2010 Through 07-05-2010",

}

Kuo, CL & Lin, D-Y 2010, Automatic measurement system for junction temperature of light emitting diodes. in 3CA 2010 - 2010 International Symposium on Computer, Communication, Control and Automation. vol. 1, 5533832, pp. 276-279, 2010 International Symposium on Computer, Communication, Control and Automation, 3CA 2010, Tainan, Taiwan, 10-05-05. https://doi.org/10.1109/3CA.2010.5533832

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AU - Lin, Der-Yuh

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N2 - In this paper, we present a PC-based automatic measurement system for measuring the junction temperatures of light-emitting diodes (LEDs) operated at different forward currents. This system is described in three major parts: (1) screen panel and function design of control software (2) data acquisition and heating hardware (3) system integration and function test. In order to check and demonstrate its performance, the junction temperatures of three InGaN/GaN multiquantum well (MQW) LEDs have been performed by this system. The operating currents are reported in the range of 10-300 mA and the measured junction temperatures are obtained from 30 to 200 °C.

AB - In this paper, we present a PC-based automatic measurement system for measuring the junction temperatures of light-emitting diodes (LEDs) operated at different forward currents. This system is described in three major parts: (1) screen panel and function design of control software (2) data acquisition and heating hardware (3) system integration and function test. In order to check and demonstrate its performance, the junction temperatures of three InGaN/GaN multiquantum well (MQW) LEDs have been performed by this system. The operating currents are reported in the range of 10-300 mA and the measured junction temperatures are obtained from 30 to 200 °C.

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