Automatic measurement system for junction temperature of light emitting diodes

C. L. Kuo, Der-Yuh Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we present a PC-based automatic measurement system for measuring the junction temperatures of light-emitting diodes (LEDs) operated at different forward currents. This system is described in three major parts: (1) screen panel and function design of control software (2) data acquisition and heating hardware (3) system integration and function test. In order to check and demonstrate its performance, the junction temperatures of three InGaN/GaN multiquantum well (MQW) LEDs have been performed by this system. The operating currents are reported in the range of 10-300 mA and the measured junction temperatures are obtained from 30 to 200 °C.

Original languageEnglish
Title of host publication3CA 2010 - 2010 International Symposium on Computer, Communication, Control and Automation
Pages276-279
Number of pages4
Volume1
DOIs
Publication statusPublished - 2010 Sep 3
Event2010 International Symposium on Computer, Communication, Control and Automation, 3CA 2010 - Tainan, Taiwan
Duration: 2010 May 52010 May 7

Other

Other2010 International Symposium on Computer, Communication, Control and Automation, 3CA 2010
CountryTaiwan
CityTainan
Period10-05-0510-05-07

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All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Hardware and Architecture
  • Control and Systems Engineering

Cite this

Kuo, C. L., & Lin, D-Y. (2010). Automatic measurement system for junction temperature of light emitting diodes. In 3CA 2010 - 2010 International Symposium on Computer, Communication, Control and Automation (Vol. 1, pp. 276-279). [5533832] https://doi.org/10.1109/3CA.2010.5533832