Anisotropic magnetoresistance and magnetic properties in La0.67Ca0.33MnO3 thin film by sputtering

H. Chou, S. J. Sun, M. N. Ou, T. C. Wu, H. L. Kao, G. L. Huang, L. Horng, C. C. Chi, D. C. Yan, M. T. Hong, Y. C. Yu

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

La0.7Ca0.3MnO3 thin films grown on SrTiO3 (100) substrates by off-axis sputtering technique exhibit a fully strained film when the thickness of films is thinner than 25 nm. Transport and magnetic properties of the films for the magnetic field applied parallel to the surface of the films were consistent and could be easily explained by the domain-rotation model. However, these properties were not consistent when the field applied perpendicular to the substrate. The critical field for which peak resistivity was observed in the magnetoresistance measurement, Hc′(⊥) ∼ 79,500 A m- 1, one order of magnitude higher than the coercive field, Hc(⊥) ∼ 7950 A m- 1. The peak width of the in-plane X-ray diffraction peak (200) of the films as measured by a five-axis X-ray diffractometer showed an exponential decrease to the thickness of films. This broadening cannot be explained by the strain effect alone. We found that nanostructures, such as the ferromagnetic phase segregation in the paramagnetic matrix or the columnar structure in films that introduced excess domain walls, could be responsible for the inconsistency between Hc′(⊥) and Hc(⊥).

Original languageEnglish
Pages (from-to)2567-2572
Number of pages6
JournalThin Solid Films
Volume515
Issue number4
DOIs
Publication statusPublished - 2006 Dec 5

Fingerprint

Enhanced magnetoresistance
Sputtering
Magnetic properties
sputtering
magnetic properties
Thin films
thin films
Domain walls
Diffractometers
Magnetoresistance
Substrates
diffractometers
Transport properties
domain wall
Nanostructures
x rays
transport properties
Magnetic fields
X ray diffraction
X rays

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Chou, H., Sun, S. J., Ou, M. N., Wu, T. C., Kao, H. L., Huang, G. L., ... Yu, Y. C. (2006). Anisotropic magnetoresistance and magnetic properties in La0.67Ca0.33MnO3 thin film by sputtering. Thin Solid Films, 515(4), 2567-2572. https://doi.org/10.1016/j.tsf.2006.07.087
Chou, H. ; Sun, S. J. ; Ou, M. N. ; Wu, T. C. ; Kao, H. L. ; Huang, G. L. ; Horng, L. ; Chi, C. C. ; Yan, D. C. ; Hong, M. T. ; Yu, Y. C. / Anisotropic magnetoresistance and magnetic properties in La0.67Ca0.33MnO3 thin film by sputtering. In: Thin Solid Films. 2006 ; Vol. 515, No. 4. pp. 2567-2572.
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abstract = "La0.7Ca0.3MnO3 thin films grown on SrTiO3 (100) substrates by off-axis sputtering technique exhibit a fully strained film when the thickness of films is thinner than 25 nm. Transport and magnetic properties of the films for the magnetic field applied parallel to the surface of the films were consistent and could be easily explained by the domain-rotation model. However, these properties were not consistent when the field applied perpendicular to the substrate. The critical field for which peak resistivity was observed in the magnetoresistance measurement, Hc′(⊥) ∼ 79,500 A m- 1, one order of magnitude higher than the coercive field, Hc(⊥) ∼ 7950 A m- 1. The peak width of the in-plane X-ray diffraction peak (200) of the films as measured by a five-axis X-ray diffractometer showed an exponential decrease to the thickness of films. This broadening cannot be explained by the strain effect alone. We found that nanostructures, such as the ferromagnetic phase segregation in the paramagnetic matrix or the columnar structure in films that introduced excess domain walls, could be responsible for the inconsistency between Hc′(⊥) and Hc(⊥).",
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Chou, H, Sun, SJ, Ou, MN, Wu, TC, Kao, HL, Huang, GL, Horng, L, Chi, CC, Yan, DC, Hong, MT & Yu, YC 2006, 'Anisotropic magnetoresistance and magnetic properties in La0.67Ca0.33MnO3 thin film by sputtering', Thin Solid Films, vol. 515, no. 4, pp. 2567-2572. https://doi.org/10.1016/j.tsf.2006.07.087

Anisotropic magnetoresistance and magnetic properties in La0.67Ca0.33MnO3 thin film by sputtering. / Chou, H.; Sun, S. J.; Ou, M. N.; Wu, T. C.; Kao, H. L.; Huang, G. L.; Horng, L.; Chi, C. C.; Yan, D. C.; Hong, M. T.; Yu, Y. C.

In: Thin Solid Films, Vol. 515, No. 4, 05.12.2006, p. 2567-2572.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Anisotropic magnetoresistance and magnetic properties in La0.67Ca0.33MnO3 thin film by sputtering

AU - Chou, H.

AU - Sun, S. J.

AU - Ou, M. N.

AU - Wu, T. C.

AU - Kao, H. L.

AU - Huang, G. L.

AU - Horng, L.

AU - Chi, C. C.

AU - Yan, D. C.

AU - Hong, M. T.

AU - Yu, Y. C.

PY - 2006/12/5

Y1 - 2006/12/5

N2 - La0.7Ca0.3MnO3 thin films grown on SrTiO3 (100) substrates by off-axis sputtering technique exhibit a fully strained film when the thickness of films is thinner than 25 nm. Transport and magnetic properties of the films for the magnetic field applied parallel to the surface of the films were consistent and could be easily explained by the domain-rotation model. However, these properties were not consistent when the field applied perpendicular to the substrate. The critical field for which peak resistivity was observed in the magnetoresistance measurement, Hc′(⊥) ∼ 79,500 A m- 1, one order of magnitude higher than the coercive field, Hc(⊥) ∼ 7950 A m- 1. The peak width of the in-plane X-ray diffraction peak (200) of the films as measured by a five-axis X-ray diffractometer showed an exponential decrease to the thickness of films. This broadening cannot be explained by the strain effect alone. We found that nanostructures, such as the ferromagnetic phase segregation in the paramagnetic matrix or the columnar structure in films that introduced excess domain walls, could be responsible for the inconsistency between Hc′(⊥) and Hc(⊥).

AB - La0.7Ca0.3MnO3 thin films grown on SrTiO3 (100) substrates by off-axis sputtering technique exhibit a fully strained film when the thickness of films is thinner than 25 nm. Transport and magnetic properties of the films for the magnetic field applied parallel to the surface of the films were consistent and could be easily explained by the domain-rotation model. However, these properties were not consistent when the field applied perpendicular to the substrate. The critical field for which peak resistivity was observed in the magnetoresistance measurement, Hc′(⊥) ∼ 79,500 A m- 1, one order of magnitude higher than the coercive field, Hc(⊥) ∼ 7950 A m- 1. The peak width of the in-plane X-ray diffraction peak (200) of the films as measured by a five-axis X-ray diffractometer showed an exponential decrease to the thickness of films. This broadening cannot be explained by the strain effect alone. We found that nanostructures, such as the ferromagnetic phase segregation in the paramagnetic matrix or the columnar structure in films that introduced excess domain walls, could be responsible for the inconsistency between Hc′(⊥) and Hc(⊥).

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U2 - 10.1016/j.tsf.2006.07.087

DO - 10.1016/j.tsf.2006.07.087

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SN - 0040-6090

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