Abstract
Nanometre-size semiconductor clusters trapped in glass matrices represent a novel class of nonlinear optical materials. Microstructural characterization of these materials by conventional and high-resolution transmission electron microscopy (TEM and HRTEM) shows the sensitivity of bright-field image contrast to the nature of the specific II-VI semiconductors (CdS, CdSe) precipitated in the glass matrices. An analysis based on electron-scattering intensity and structure-factor calculations is presented to account for the quality of TEM and HRTEM images observed for CdS- and CdSe-containing quantum-dot glasses.
Original language | English |
---|---|
Pages (from-to) | 327-332 |
Number of pages | 6 |
Journal | Philosophical Magazine Letters |
Volume | 61 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1990 Jun |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics