Analysis of pentacene thin film transistors in different atmospheres

Yu Wu Wang, Horng Long Cheng, Yi Kai Wang, Tang Hsiang Hu, Jia Chong Ho, Cheng Chung Lee, Tan Fu Lei, Ching Fa Yeh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This investigation addresses the electrical properties of pentacene-based thin film transistors in air, dry air and high vacuum. A potential barrier model was applied to explain the gate dependent field effect mobility behavior. The results show the trap density in air higher than that in a vacuum.

Original languageEnglish
Title of host publicationProceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05
EditorsH.P. David Shieh, F.C. Chen
Pages520-522
Number of pages3
Publication statusPublished - 2005 Dec 1
EventInternational Display Manufacturing Conference and Exhibition, IDMC'05 - Taipei, Japan
Duration: 2005 Feb 212005 Feb 24

Publication series

NameInternational Display Manufacturing Conference and Exhibition, IDMC'05

Other

OtherInternational Display Manufacturing Conference and Exhibition, IDMC'05
CountryJapan
CityTaipei
Period05-02-2105-02-24

Fingerprint

Thin film transistors
Air
Vacuum
Electric properties

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Wang, Y. W., Cheng, H. L., Wang, Y. K., Hu, T. H., Ho, J. C., Lee, C. C., ... Yeh, C. F. (2005). Analysis of pentacene thin film transistors in different atmospheres. In H. P. David Shieh, & F. C. Chen (Eds.), Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05 (pp. 520-522). (International Display Manufacturing Conference and Exhibition, IDMC'05).
Wang, Yu Wu ; Cheng, Horng Long ; Wang, Yi Kai ; Hu, Tang Hsiang ; Ho, Jia Chong ; Lee, Cheng Chung ; Lei, Tan Fu ; Yeh, Ching Fa. / Analysis of pentacene thin film transistors in different atmospheres. Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05. editor / H.P. David Shieh ; F.C. Chen. 2005. pp. 520-522 (International Display Manufacturing Conference and Exhibition, IDMC'05).
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abstract = "This investigation addresses the electrical properties of pentacene-based thin film transistors in air, dry air and high vacuum. A potential barrier model was applied to explain the gate dependent field effect mobility behavior. The results show the trap density in air higher than that in a vacuum.",
author = "Wang, {Yu Wu} and Cheng, {Horng Long} and Wang, {Yi Kai} and Hu, {Tang Hsiang} and Ho, {Jia Chong} and Lee, {Cheng Chung} and Lei, {Tan Fu} and Yeh, {Ching Fa}",
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Wang, YW, Cheng, HL, Wang, YK, Hu, TH, Ho, JC, Lee, CC, Lei, TF & Yeh, CF 2005, Analysis of pentacene thin film transistors in different atmospheres. in HP David Shieh & FC Chen (eds), Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05. International Display Manufacturing Conference and Exhibition, IDMC'05, pp. 520-522, International Display Manufacturing Conference and Exhibition, IDMC'05, Taipei, Japan, 05-02-21.

Analysis of pentacene thin film transistors in different atmospheres. / Wang, Yu Wu; Cheng, Horng Long; Wang, Yi Kai; Hu, Tang Hsiang; Ho, Jia Chong; Lee, Cheng Chung; Lei, Tan Fu; Yeh, Ching Fa.

Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05. ed. / H.P. David Shieh; F.C. Chen. 2005. p. 520-522 (International Display Manufacturing Conference and Exhibition, IDMC'05).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Wang YW, Cheng HL, Wang YK, Hu TH, Ho JC, Lee CC et al. Analysis of pentacene thin film transistors in different atmospheres. In David Shieh HP, Chen FC, editors, Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05. 2005. p. 520-522. (International Display Manufacturing Conference and Exhibition, IDMC'05).