Abstract
This paper presents the analysis of the equivalent 10-Hz voltage flicker measurement (δ V10) based on the IEC fliekermeter standard. The δ V10 method has been employed to evaluate voltage flicker for more than two decades in several Asian countries and not been updated since 1978. Therefore, a careful inspection from various aspects was made against the δ V10 method. The results uncover the deficiencies in the reliability of the δ V10 method for voltage flicker measurement.
| Original language | English |
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| Title of host publication | 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings |
| DOIs | |
| Publication status | Published - 2008 Oct 30 |
| Event | 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Chengdu, China Duration: 2008 Apr 21 → 2008 Apr 24 |
Publication series
| Name | Proceedings of the IEEE International Conference on Industrial Technology |
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Other
| Other | 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 |
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| Country | China |
| City | Chengdu |
| Period | 08-04-21 → 08-04-24 |
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All Science Journal Classification (ASJC) codes
- Computer Science Applications
- Electrical and Electronic Engineering
Cite this
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Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard. / Wang, Chau-Shing; Chen, Liang-Rui; Yang, Wen-Ren.
2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings. 2008. 4608658 (Proceedings of the IEEE International Conference on Industrial Technology).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard
AU - Wang, Chau-Shing
AU - Chen, Liang-Rui
AU - Yang, Wen-Ren
PY - 2008/10/30
Y1 - 2008/10/30
N2 - This paper presents the analysis of the equivalent 10-Hz voltage flicker measurement (δ V10) based on the IEC fliekermeter standard. The δ V10 method has been employed to evaluate voltage flicker for more than two decades in several Asian countries and not been updated since 1978. Therefore, a careful inspection from various aspects was made against the δ V10 method. The results uncover the deficiencies in the reliability of the δ V10 method for voltage flicker measurement.
AB - This paper presents the analysis of the equivalent 10-Hz voltage flicker measurement (δ V10) based on the IEC fliekermeter standard. The δ V10 method has been employed to evaluate voltage flicker for more than two decades in several Asian countries and not been updated since 1978. Therefore, a careful inspection from various aspects was made against the δ V10 method. The results uncover the deficiencies in the reliability of the δ V10 method for voltage flicker measurement.
UR - http://www.scopus.com/inward/record.url?scp=54549115063&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=54549115063&partnerID=8YFLogxK
U2 - 10.1109/ICIT.2008.4608658
DO - 10.1109/ICIT.2008.4608658
M3 - Conference contribution
AN - SCOPUS:54549115063
SN - 9781424417063
T3 - Proceedings of the IEEE International Conference on Industrial Technology
BT - 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings
ER -