TY - GEN
T1 - Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard
AU - Wang, Chau-Shing
AU - Chen, Liang-Rui
AU - Yang, Wen-Ren
PY - 2008/10/30
Y1 - 2008/10/30
N2 - This paper presents the analysis of the equivalent 10-Hz voltage flicker measurement (δ V10) based on the IEC fliekermeter standard. The δ V10 method has been employed to evaluate voltage flicker for more than two decades in several Asian countries and not been updated since 1978. Therefore, a careful inspection from various aspects was made against the δ V10 method. The results uncover the deficiencies in the reliability of the δ V10 method for voltage flicker measurement.
AB - This paper presents the analysis of the equivalent 10-Hz voltage flicker measurement (δ V10) based on the IEC fliekermeter standard. The δ V10 method has been employed to evaluate voltage flicker for more than two decades in several Asian countries and not been updated since 1978. Therefore, a careful inspection from various aspects was made against the δ V10 method. The results uncover the deficiencies in the reliability of the δ V10 method for voltage flicker measurement.
UR - http://www.scopus.com/inward/record.url?scp=54549115063&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=54549115063&partnerID=8YFLogxK
U2 - 10.1109/ICIT.2008.4608658
DO - 10.1109/ICIT.2008.4608658
M3 - Conference contribution
AN - SCOPUS:54549115063
SN - 9781424417063
T3 - Proceedings of the IEEE International Conference on Industrial Technology
BT - 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings
T2 - 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008
Y2 - 21 April 2008 through 24 April 2008
ER -