Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard

Chau-Shing Wang; Liang-Rui Chen; Wen-Ren Yang

doi:10.1109/ICIT.2008.4608658

Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard

Chau-Shing Wang, Liang-Rui Chen, Wen-Ren Yang

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

6 Citations (Scopus)

Abstract

This paper presents the analysis of the equivalent 10-Hz voltage flicker measurement (δ V₁₀) based on the IEC fliekermeter standard. The δ V₁₀ method has been employed to evaluate voltage flicker for more than two decades in several Asian countries and not been updated since 1978. Therefore, a careful inspection from various aspects was made against the δ V₁₀ method. The results uncover the deficiencies in the reliability of the δ V₁₀ method for voltage flicker measurement.

Original language	English
Title of host publication	2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings
DOIs	https://doi.org/10.1109/ICIT.2008.4608658
Publication status	Published - 2008 Oct 30
Event	2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Chengdu, China Duration: 2008 Apr 21 → 2008 Apr 24

Publication series

Name	Proceedings of the IEEE International Conference on Industrial Technology

Other

Other	2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008
Country	China
City	Chengdu
Period	08-04-21 → 08-04-24

All Science Journal Classification (ASJC) codes

Computer Science Applications
Electrical and Electronic Engineering

Access to Document

10.1109/ICIT.2008.4608658

Fingerprint Dive into the research topics of 'Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard'. Together they form a unique fingerprint.

Cite this

@inproceedings{dda2a308fb534d4bbc0aa97d9802b2a4,

title = "Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard",

abstract = "This paper presents the analysis of the equivalent 10-Hz voltage flicker measurement (δ V10) based on the IEC fliekermeter standard. The δ V10 method has been employed to evaluate voltage flicker for more than two decades in several Asian countries and not been updated since 1978. Therefore, a careful inspection from various aspects was made against the δ V10 method. The results uncover the deficiencies in the reliability of the δ V10 method for voltage flicker measurement.",

author = "Chau-Shing Wang and Liang-Rui Chen and Wen-Ren Yang",

year = "2008",

month = oct,

day = "30",

doi = "10.1109/ICIT.2008.4608658",

language = "English",

isbn = "9781424417063",

series = "Proceedings of the IEEE International Conference on Industrial Technology",

booktitle = "2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings",

note = "2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 ; Conference date: 21-04-2008 Through 24-04-2008",

}

Wang, C-S , Chen, L-R & Yang, W-R 2008, Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard. in 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings., 4608658, Proceedings of the IEEE International Conference on Industrial Technology, 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008, Chengdu, China, 08-04-21. https://doi.org/10.1109/ICIT.2008.4608658

Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard. / Wang, Chau-Shing ; Chen, Liang-Rui ; Yang, Wen-Ren.

2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings. 2008. 4608658 (Proceedings of the IEEE International Conference on Industrial Technology).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard

AU - Wang, Chau-Shing

AU - Chen, Liang-Rui

AU - Yang, Wen-Ren

PY - 2008/10/30

Y1 - 2008/10/30

N2 - This paper presents the analysis of the equivalent 10-Hz voltage flicker measurement (δ V10) based on the IEC fliekermeter standard. The δ V10 method has been employed to evaluate voltage flicker for more than two decades in several Asian countries and not been updated since 1978. Therefore, a careful inspection from various aspects was made against the δ V10 method. The results uncover the deficiencies in the reliability of the δ V10 method for voltage flicker measurement.

AB - This paper presents the analysis of the equivalent 10-Hz voltage flicker measurement (δ V10) based on the IEC fliekermeter standard. The δ V10 method has been employed to evaluate voltage flicker for more than two decades in several Asian countries and not been updated since 1978. Therefore, a careful inspection from various aspects was made against the δ V10 method. The results uncover the deficiencies in the reliability of the δ V10 method for voltage flicker measurement.

UR - http://www.scopus.com/inward/record.url?scp=54549115063&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=54549115063&partnerID=8YFLogxK

U2 - 10.1109/ICIT.2008.4608658

DO - 10.1109/ICIT.2008.4608658

M3 - Conference contribution

AN - SCOPUS:54549115063

SN - 9781424417063

T3 - Proceedings of the IEEE International Conference on Industrial Technology

BT - 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings

T2 - 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008

Y2 - 21 April 2008 through 24 April 2008

ER -