Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

This paper presents the analysis of the equivalent 10-Hz voltage flicker measurement (δ V10) based on the IEC fliekermeter standard. The δ V10 method has been employed to evaluate voltage flicker for more than two decades in several Asian countries and not been updated since 1978. Therefore, a careful inspection from various aspects was made against the δ V10 method. The results uncover the deficiencies in the reliability of the δ V10 method for voltage flicker measurement.

Original languageEnglish
Title of host publication2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings
DOIs
Publication statusPublished - 2008 Oct 30
Event2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Chengdu, China
Duration: 2008 Apr 212008 Apr 24

Publication series

NameProceedings of the IEEE International Conference on Industrial Technology

Other

Other2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008
CountryChina
CityChengdu
Period08-04-2108-04-24

Fingerprint

Electric potential
Inspection

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Wang, C-S., Chen, L-R., & Yang, W-R. (2008). Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard. In 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings [4608658] (Proceedings of the IEEE International Conference on Industrial Technology). https://doi.org/10.1109/ICIT.2008.4608658
Wang, Chau-Shing ; Chen, Liang-Rui ; Yang, Wen-Ren. / Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard. 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings. 2008. (Proceedings of the IEEE International Conference on Industrial Technology).
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Wang, C-S, Chen, L-R & Yang, W-R 2008, Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard. in 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings., 4608658, Proceedings of the IEEE International Conference on Industrial Technology, 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008, Chengdu, China, 08-04-21. https://doi.org/10.1109/ICIT.2008.4608658

Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard. / Wang, Chau-Shing; Chen, Liang-Rui; Yang, Wen-Ren.

2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings. 2008. 4608658 (Proceedings of the IEEE International Conference on Industrial Technology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Wang C-S, Chen L-R, Yang W-R. Analysis of equivalent 10-Hz voltage flicker measurement using IEC fliekermeter standard. In 2008 IEEE International Conference on Industrial Technology, IEEE ICIT 2008 - Conference Proceedings. 2008. 4608658. (Proceedings of the IEEE International Conference on Industrial Technology). https://doi.org/10.1109/ICIT.2008.4608658