Abstract
This study proposes an alternative and simple method for measuring full-field refractive index. This method is based on the phase-shifting technique with a modulated electro-optical (EO) modulator and the phenomenon of total internal reflection. To this purpose, a linear polarized light is expanded and incident on the interface between the prism and the tested specimen, and the reflected light passes through an analyzer for interference. The phase difference between the s- and p-polarized light is sensitive to the refractive index of the tested specimen when the total internal reflection appears on this interface. Based on this effect, the resulting phase differences make it possible to analyze the refractive index of the tested specimen through a phase-shifting technique with a modulated EO modulator. The feasibility of this method was verified by experiment, and the measurement resolution can reach a value of refractive index unit of at least 3.552×10-4. This method has advantages of simple installation, ease of operation, and fast measurement.
| Original language | English |
|---|---|
| Article number | 094101 |
| Journal | Optical Engineering |
| Volume | 54 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 2015 Sep 1 |
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All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Engineering(all)
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Alternative phase-shifting technique for measuring full-field refractive index. / Chen, Kun Huang; Chen, Jing Heng; Lin, Jiun You; Chu, Yen Chang.
In: Optical Engineering, Vol. 54, No. 9, 094101, 01.09.2015.Research output: Contribution to journal › Article
TY - JOUR
T1 - Alternative phase-shifting technique for measuring full-field refractive index
AU - Chen, Kun Huang
AU - Chen, Jing Heng
AU - Lin, Jiun You
AU - Chu, Yen Chang
PY - 2015/9/1
Y1 - 2015/9/1
N2 - This study proposes an alternative and simple method for measuring full-field refractive index. This method is based on the phase-shifting technique with a modulated electro-optical (EO) modulator and the phenomenon of total internal reflection. To this purpose, a linear polarized light is expanded and incident on the interface between the prism and the tested specimen, and the reflected light passes through an analyzer for interference. The phase difference between the s- and p-polarized light is sensitive to the refractive index of the tested specimen when the total internal reflection appears on this interface. Based on this effect, the resulting phase differences make it possible to analyze the refractive index of the tested specimen through a phase-shifting technique with a modulated EO modulator. The feasibility of this method was verified by experiment, and the measurement resolution can reach a value of refractive index unit of at least 3.552×10-4. This method has advantages of simple installation, ease of operation, and fast measurement.
AB - This study proposes an alternative and simple method for measuring full-field refractive index. This method is based on the phase-shifting technique with a modulated electro-optical (EO) modulator and the phenomenon of total internal reflection. To this purpose, a linear polarized light is expanded and incident on the interface between the prism and the tested specimen, and the reflected light passes through an analyzer for interference. The phase difference between the s- and p-polarized light is sensitive to the refractive index of the tested specimen when the total internal reflection appears on this interface. Based on this effect, the resulting phase differences make it possible to analyze the refractive index of the tested specimen through a phase-shifting technique with a modulated EO modulator. The feasibility of this method was verified by experiment, and the measurement resolution can reach a value of refractive index unit of at least 3.552×10-4. This method has advantages of simple installation, ease of operation, and fast measurement.
UR - http://www.scopus.com/inward/record.url?scp=84941330637&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84941330637&partnerID=8YFLogxK
U2 - 10.1117/1.OE.54.9.094101
DO - 10.1117/1.OE.54.9.094101
M3 - Article
AN - SCOPUS:84941330637
VL - 54
JO - Optical Engineering
JF - Optical Engineering
SN - 0091-3286
IS - 9
M1 - 094101
ER -