A token scan architecture for low power testing

Tsung-Chu Huang, Kuen Jong Lee

Research output: Contribution to journalConference article

31 Citations (Scopus)

Abstract

This paper presents a novel scan architecture for low-power testing, which employs the techniques of multiphase clocking, token ring, and clockgating. When the multiphase clocking technique is directly employed to a scan chain, inter-phase skews and large routing area will be the problems. We develop a token scan cell design to address these problems. To reduce the power dissipation due to the clock and scan-in data trees, we propose a novel clockgating technique that takes the advantage of the regularity and periodicity of the token scan chain. Combining the three techniques, the token scan architecture can efficiently reduce the data transitions in the scan circuits as well as the switching activity in both the clock and the scan-in data trees. From experiments, more than 95% of power reduction can be achieved for most circuits with long scan chains.

Original languageEnglish
Pages (from-to)660-669
Number of pages10
JournalIEEE International Test Conference (TC)
Publication statusPublished - 2001 Dec 1
EventInternational Test Conference 2001 Proceedings - Baltimore, MD, United States
Duration: 2001 Oct 302001 Nov 1

Fingerprint

Clocks
Testing
Networks (circuits)
Energy dissipation
Periodicity
Skew
Dissipation
Routing
Experiments
Regularity
Ring
Architecture
Cell
Experiment

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

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A token scan architecture for low power testing. / Huang, Tsung-Chu; Lee, Kuen Jong.

In: IEEE International Test Conference (TC), 01.12.2001, p. 660-669.

Research output: Contribution to journalConference article

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