A temperature-stable CMOS voltage reference

Zhi-Ming Lin, Kuei Chen Huang

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

A CMOS voltage reference which employ a supply-independent bias circuit and a temperature-compensation circuit has been developed that exhibits extremely low drift with power supply and temperature. The simulated output voltage drift is less than 20 μ V/°C (13 ppm/°C) and 4.8 mV/V for supply voltage between 12 V and 16 V and temperature ranging from 25°C to +125°C.

Original languageEnglish
Title of host publicationAdvances in Physics, Electronics and Signal Processing Applications
PublisherWorld Scientific and Engineering Academy and Society
Pages111-113
Number of pages3
ISBN (Print)9608052173
Publication statusPublished - 2000 Dec 1

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Electric potential
Networks (circuits)
Temperature
Compensation and Redress

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Lin, Z-M., & Huang, K. C. (2000). A temperature-stable CMOS voltage reference. In Advances in Physics, Electronics and Signal Processing Applications (pp. 111-113). World Scientific and Engineering Academy and Society.
Lin, Zhi-Ming ; Huang, Kuei Chen. / A temperature-stable CMOS voltage reference. Advances in Physics, Electronics and Signal Processing Applications. World Scientific and Engineering Academy and Society, 2000. pp. 111-113
@inbook{3c652c42639546d0ad265ffc2279beaa,
title = "A temperature-stable CMOS voltage reference",
abstract = "A CMOS voltage reference which employ a supply-independent bias circuit and a temperature-compensation circuit has been developed that exhibits extremely low drift with power supply and temperature. The simulated output voltage drift is less than 20 μ V/°C (13 ppm/°C) and 4.8 mV/V for supply voltage between 12 V and 16 V and temperature ranging from 25°C to +125°C.",
author = "Zhi-Ming Lin and Huang, {Kuei Chen}",
year = "2000",
month = "12",
day = "1",
language = "English",
isbn = "9608052173",
pages = "111--113",
booktitle = "Advances in Physics, Electronics and Signal Processing Applications",
publisher = "World Scientific and Engineering Academy and Society",
address = "Greece",

}

Lin, Z-M & Huang, KC 2000, A temperature-stable CMOS voltage reference. in Advances in Physics, Electronics and Signal Processing Applications. World Scientific and Engineering Academy and Society, pp. 111-113.

A temperature-stable CMOS voltage reference. / Lin, Zhi-Ming; Huang, Kuei Chen.

Advances in Physics, Electronics and Signal Processing Applications. World Scientific and Engineering Academy and Society, 2000. p. 111-113.

Research output: Chapter in Book/Report/Conference proceedingChapter

TY - CHAP

T1 - A temperature-stable CMOS voltage reference

AU - Lin, Zhi-Ming

AU - Huang, Kuei Chen

PY - 2000/12/1

Y1 - 2000/12/1

N2 - A CMOS voltage reference which employ a supply-independent bias circuit and a temperature-compensation circuit has been developed that exhibits extremely low drift with power supply and temperature. The simulated output voltage drift is less than 20 μ V/°C (13 ppm/°C) and 4.8 mV/V for supply voltage between 12 V and 16 V and temperature ranging from 25°C to +125°C.

AB - A CMOS voltage reference which employ a supply-independent bias circuit and a temperature-compensation circuit has been developed that exhibits extremely low drift with power supply and temperature. The simulated output voltage drift is less than 20 μ V/°C (13 ppm/°C) and 4.8 mV/V for supply voltage between 12 V and 16 V and temperature ranging from 25°C to +125°C.

UR - http://www.scopus.com/inward/record.url?scp=4944254495&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4944254495&partnerID=8YFLogxK

M3 - Chapter

SN - 9608052173

SP - 111

EP - 113

BT - Advances in Physics, Electronics and Signal Processing Applications

PB - World Scientific and Engineering Academy and Society

ER -

Lin Z-M, Huang KC. A temperature-stable CMOS voltage reference. In Advances in Physics, Electronics and Signal Processing Applications. World Scientific and Engineering Academy and Society. 2000. p. 111-113