A novel technique for the study of defects using quantum wires

Doran D. Smith, Martin Wybourne, J. C. Wu, A. DeAnni, Mary Lloyd LeMeune, Robert P. Moerkirk, Wayne H. Chang, Lemonia Fotiadis

Research output: Contribution to journal › Article

4 Citations (Scopus)

Abstract

A technique utilizing changes in the conductance of a quantum wire to measure the detrapping time and density of electron traps is described. The technique permits the study of defects in heterostructure material over a wide range of doping levels and under a variety of conditions. The technique also introduces the possibility of studying one microsecond or faster (de)trapping times.

Original languageEnglish
Pages (from-to)313-317
Number of pages5
JournalSolid State Communications
Volume91
Issue number4
DOIs
Publication statusPublished - 1994 Jul

Fingerprint

Electron traps
Semiconductor quantum wires
quantum wires
Heterojunctions
Doping (additives)
Defects
defects
trapping
traps
electrons

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

Cite this

Smith, D. D., Wybourne, M., Wu, J. C., DeAnni, A., LeMeune, M. L., Moerkirk, R. P., ... Fotiadis, L. (1994). A novel technique for the study of defects using quantum wires. Solid State Communications, 91(4), 313-317. https://doi.org/10.1016/0038-1098(94)90308-5
Smith, Doran D. ; Wybourne, Martin ; Wu, J. C. ; DeAnni, A. ; LeMeune, Mary Lloyd ; Moerkirk, Robert P. ; Chang, Wayne H. ; Fotiadis, Lemonia. / A novel technique for the study of defects using quantum wires. In: Solid State Communications. 1994 ; Vol. 91, No. 4. pp. 313-317.
@article{772ebd0842ca4448bcd10019e8d10fa0,
title = "A novel technique for the study of defects using quantum wires",
abstract = "A technique utilizing changes in the conductance of a quantum wire to measure the detrapping time and density of electron traps is described. The technique permits the study of defects in heterostructure material over a wide range of doping levels and under a variety of conditions. The technique also introduces the possibility of studying one microsecond or faster (de)trapping times.",
author = "Smith, {Doran D.} and Martin Wybourne and Wu, {J. C.} and A. DeAnni and LeMeune, {Mary Lloyd} and Moerkirk, {Robert P.} and Chang, {Wayne H.} and Lemonia Fotiadis",
year = "1994",
month = "7",
doi = "10.1016/0038-1098(94)90308-5",
language = "English",
volume = "91",
pages = "313--317",
journal = "Solid State Communications",
issn = "0038-1098",
publisher = "Elsevier Limited",
number = "4",

}

Smith, DD, Wybourne, M, Wu, JC, DeAnni, A, LeMeune, ML, Moerkirk, RP, Chang, WH & Fotiadis, L 1994, 'A novel technique for the study of defects using quantum wires', Solid State Communications, vol. 91, no. 4, pp. 313-317. https://doi.org/10.1016/0038-1098(94)90308-5

A novel technique for the study of defects using quantum wires. / Smith, Doran D.; Wybourne, Martin; Wu, J. C.; DeAnni, A.; LeMeune, Mary Lloyd; Moerkirk, Robert P.; Chang, Wayne H.; Fotiadis, Lemonia.

In: Solid State Communications, Vol. 91, No. 4, 07.1994, p. 313-317.

Research output: Contribution to journal › Article

TY - JOUR

T1 - A novel technique for the study of defects using quantum wires

AU - Smith, Doran D.

AU - Wybourne, Martin

AU - Wu, J. C.

AU - DeAnni, A.

AU - LeMeune, Mary Lloyd

AU - Moerkirk, Robert P.

AU - Chang, Wayne H.

AU - Fotiadis, Lemonia

PY - 1994/7

Y1 - 1994/7

N2 - A technique utilizing changes in the conductance of a quantum wire to measure the detrapping time and density of electron traps is described. The technique permits the study of defects in heterostructure material over a wide range of doping levels and under a variety of conditions. The technique also introduces the possibility of studying one microsecond or faster (de)trapping times.

AB - A technique utilizing changes in the conductance of a quantum wire to measure the detrapping time and density of electron traps is described. The technique permits the study of defects in heterostructure material over a wide range of doping levels and under a variety of conditions. The technique also introduces the possibility of studying one microsecond or faster (de)trapping times.

UR - http://www.scopus.com/inward/record.url?scp=0028464810&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028464810&partnerID=8YFLogxK

U2 - 10.1016/0038-1098(94)90308-5

DO - 10.1016/0038-1098(94)90308-5

M3 - Article

AN - SCOPUS:0028464810

VL - 91

SP - 313

EP - 317

JO - Solid State Communications

JF - Solid State Communications

SN - 0038-1098

IS - 4

ER -

Smith DD, Wybourne M, Wu JC, DeAnni A, LeMeune ML, Moerkirk RP et al. A novel technique for the study of defects using quantum wires. Solid State Communications. 1994 Jul;91(4):313-317. https://doi.org/10.1016/0038-1098(94)90308-5

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