Abstract
A technique utilizing changes in the conductance of a quantum wire to measure the detrapping time and density of electron traps is described. The technique permits the study of defects in heterostructure material over a wide range of doping levels and under a variety of conditions. The technique also introduces the possibility of studying one microsecond or faster (de)trapping times.
Original language | English |
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Pages (from-to) | 313-317 |
Number of pages | 5 |
Journal | Solid State Communications |
Volume | 91 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1994 Jul |
All Science Journal Classification (ASJC) codes
- Chemistry(all)
- Condensed Matter Physics
- Materials Chemistry