A novel technique for the study of defects using quantum wires

Doran D. Smith; Martin Wybourne; J. C. Wu; A. DeAnni; Mary Lloyd LeMeune; Robert P. Moerkirk; Wayne H. Chang; Lemonia Fotiadis

doi:10.1016/0038-1098(94)90308-5

A novel technique for the study of defects using quantum wires

Doran D. Smith, Martin Wybourne, J. C. Wu, A. DeAnni, Mary Lloyd LeMeune, Robert P. Moerkirk, Wayne H. Chang, Lemonia Fotiadis

Department of Physics

Research output: Contribution to journal › Article

4 Citations (Scopus)

Abstract

A technique utilizing changes in the conductance of a quantum wire to measure the detrapping time and density of electron traps is described. The technique permits the study of defects in heterostructure material over a wide range of doping levels and under a variety of conditions. The technique also introduces the possibility of studying one microsecond or faster (de)trapping times.

Original language	English
Pages (from-to)	313-317
Number of pages	5
Journal	Solid State Communications
Volume	91
Issue number	4
DOIs	https://doi.org/10.1016/0038-1098(94)90308-5
Publication status	Published - 1994 Jul

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All Science Journal Classification (ASJC) codes

Chemistry(all)
Condensed Matter Physics
Materials Chemistry

Cite this

Smith, D. D., Wybourne, M., Wu, J. C., DeAnni, A., LeMeune, M. L., Moerkirk, R. P., Chang, W. H., & Fotiadis, L. (1994). A novel technique for the study of defects using quantum wires. Solid State Communications, 91(4), 313-317. https://doi.org/10.1016/0038-1098(94)90308-5

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AU - Chang, Wayne H.

AU - Fotiadis, Lemonia

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Access to Document

10.1016/0038-1098(94)90308-5