Abstract
A novel design for the precise measurement of surface variation based on volume holography is proposed. The volume hologram is a spatial filter, which records the index grating corresponding to the interference fringes by a plane wave and a divergent spherical wave. In the measuring process, a point source attached to a probe is used to read the hologram. A precise measurement can be achieved because the horizontal displacement of the point source is very sensitive to the hologram. This sensitivity is higher than that of a holographic confocal microscopy based on the longitudinal displacement.
Original language | English |
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Pages (from-to) | 319-321 |
Number of pages | 3 |
Journal | Microwave and Optical Technology Letters |
Volume | 34 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2002 Aug 20 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering